Ol'khovskaya S, Splettstoesser J, Moskalets M, Büttiker M
Department of Metal and Semiconductor Physics, NTU Kharkiv Polytechnic Institute, Kharkiv, Ukraine.
Phys Rev Lett. 2008 Oct 17;101(16):166802. doi: 10.1103/PhysRevLett.101.166802. Epub 2008 Oct 14.
We investigate the shot noise generated by particle emission from a mesoscopic capacitor into an edge state coupled to another edge state at a quantum point contact (QPC). For a capacitor subject to a periodic voltage the resulting shot noise is proportional to the number of particles (both electrons and holes) emitted during a period. The shot noise is proportional to the driving frequency, however it is independent of the applied voltage. If two capacitors are coupled to a QPC at different sides then the resulting shot noise is maximally the sum of noises produced by each of the capacitors. However, the noise is suppressed if particles of the same kind are emitted simultaneously.
我们研究了从介观电容器发射粒子进入与量子点接触（QPC）处的另一个边缘态耦合的边缘态时产生的散粒噪声。对于施加周期性电压的电容器，产生的散粒噪声与一个周期内发射的粒子（电子和空穴）数量成正比。散粒噪声与驱动频率成正比，然而它与施加的电压无关。如果两个电容器在不同侧耦合到一个QPC，那么产生的散粒噪声最大为每个电容器产生的噪声之和。然而，如果同时发射同类粒子，噪声会被抑制。
