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具有宽带光抗反射性能的高度有序硅倒置纳米锥阵列

Highly-ordered silicon inverted nanocone arrays with broadband light antireflectance.

作者信息

Zhang Dong, Ren Weina, Zhu Zhichao, Zhang Haifeng, Liu Bo, Shi Wangzhou, Qin Xiaomei, Cheng Chuanwei

机构信息

Department of Physics, Shanghai Normal University, No.100 Guilin Road, Shanghai, 200234 PR China.

Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology and School of Physics Science and Engineering, Tongji University, 1239 Siping Road, Shanghai, 200092 PR China.

出版信息

Nanoscale Res Lett. 2015 Jan 22;10:9. doi: 10.1186/s11671-014-0718-x. eCollection 2015 Dec.

Abstract

In this work, highly-ordered silicon inverted nanocone arrays are fabricated by integration of nanosphere lithography with reactive ion etching (RIE) method. The optical characteristics of as-prepared Si inverted nanocone arrays are investigated both by experiments and simulations. It is found that the Si nanocone arrays present excellent broadband light antireflectance properties, which are attributed to the gradient in the effective refractive index of nanocones and enhanced light trapping owing to optical diffraction. The inverted Si nanocone arrays might find a variety of applications in solar cells and photodetectors.

摘要

在本工作中,通过将纳米球光刻技术与反应离子刻蚀(RIE)方法相结合,制备了高度有序的硅倒置纳米锥阵列。通过实验和模拟研究了所制备的硅倒置纳米锥阵列的光学特性。发现硅纳米锥阵列具有优异的宽带光抗反射性能,这归因于纳米锥有效折射率的梯度以及光学衍射导致的光捕获增强。倒置的硅纳米锥阵列可能在太阳能电池和光电探测器中有多种应用。

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