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人工耳蜗的长期电极阻抗变化及故障发生率

Long-term electrode impedance changes and failure prevalence in cochlear implants.

作者信息

Newbold Carrie, Risi Frank, Hollow Rodney, Yusof Yusmeera, Dowell Richard

机构信息

* Department of Audiology and Speech Pathology, The University of Melbourne , Carlton , Australia.

出版信息

Int J Audiol. 2015 Jul;54(7):453-60. doi: 10.3109/14992027.2014.1001076. Epub 2015 Mar 13.

DOI:10.3109/14992027.2014.1001076
PMID:25766491
Abstract

OBJECTIVE

This study assessed the prevalence of electrode failures and electrode impedance measures in Nucleus cochlear implants around initial activation (an average of 16 days after surgery) and after 8 to 12 years of device use.

DESIGN

Retrospective data from the Melbourne Cochlear Implant Clinic was collated and analysed.

STUDY SAMPLE

Included in this study were 232 adults, all of whom were implanted at the clinic between March 1998 and August 2005.

RESULTS

Overall 0.5% of electrodes failed over the entire test period, with 5.6% of devices showing one or more electrode failure. The majority of these failures were recorded by initial activation. The numbers of electrode failures have decreased over time with array type, such that no failures were recorded with the currently available Contour Advance array. Array type was shown to affect electrode impedance at both time points, with the Contour and Contour Advance arrays having significantly higher absolute values than the Banded array. However, the Banded array had significantly higher area-normalized impedances at initial and final measures than the Contour and Contour Advance array.

CONCLUSIONS

A relatively low incidence of electrode failures were recorded for the Nucleus devices of these recipients. Electrode impedance dropped for all array types after 8 to 12 years of device use.

摘要

目的

本研究评估了 Nucleus 人工耳蜗在初次激活时(平均术后 16 天)以及使用 8 至 12 年后电极故障的发生率和电极阻抗测量值。

设计

整理并分析了墨尔本人工耳蜗诊所的回顾性数据。

研究样本

本研究纳入了 232 名成年人,他们均于 1998 年 3 月至 2005 年 8 月期间在该诊所接受植入手术。

结果

在整个测试期间,总体电极故障率为 0.5%,5.6%的设备出现一个或多个电极故障。这些故障大多在初次激活时记录。随着时间推移,电极故障数量随阵列类型减少,以至于目前可用的 Contour Advance 阵列未记录到故障。在两个时间点,阵列类型均显示会影响电极阻抗,Contour 和 Contour Advance 阵列的绝对值显著高于带状阵列。然而,带状阵列在初次和最终测量时的面积归一化阻抗显著高于 Contour 和 Contour Advance 阵列。

结论

这些接受者的 Nucleus 设备记录到的电极故障发生率相对较低。使用 8 至 12 年后,所有阵列类型的电极阻抗均下降。

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