Yeoh Catriona S M, Rossouw David, Saghi Zineb, Burdet Pierre, Leary Rowan K, Midgley Paul A
Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge,CB3 0FS,UK.
Microsc Microanal. 2015 Jun;21(3):759-64. doi: 10.1017/S1431927615000227. Epub 2015 Mar 20.
A simple model is proposed to account for the loss of collected X-ray signal by the shadowing of X-ray detectors in the scanning transmission electron microscope. The model is intended to aid the analysis of three-dimensional elemental data sets acquired using energy-dispersive X-ray tomography methods where shadow-free specimen holders are unsuitable or unavailable. The model also provides a useful measure of the detection system geometry.
