Microelectronics Research Center, The University of Texas at Austin, Austin, Texas 78758, United States.
ACS Nano. 2015 Apr 28;9(4):3772-9. doi: 10.1021/nn5065716. Epub 2015 Apr 13.
Reflection high-energy electron diffraction (RHEED), scanning tunneling microscopy (STM), vibrating sample magnetometry, and other physical property measurements are used to investigate the structure, morphology, magnetic, and magnetotransport properties of (001)-oriented Cr2Te3 thin films grown on Al2O3(0001) and Si(111)-(7×7) surfaces by molecular beam epitaxy. Streaky RHEED patterns indicate flat smooth film growth on both substrates. STM studies show the hexagonal arrangements of surface atoms. Determination of the lattice parameter from the atomically resolved STM image is consistent with the bulk crystal structures. Magnetic measurements show the film is ferromagnetic, having a Curie temperature of about 180 K, and a spin glass-like behavior was observed below 35 K. Magnetotransport measurements show the metallic nature of the film with a perpendicular magnetic anisotropy along the c-axis.
反射高能电子衍射（RHEED）、扫描隧道显微镜（STM）、振动样品磁强计以及其他物理性能测量用于研究通过分子束外延在 Al2O3(0001) 和 Si(111)-(7×7) 表面生长的（001）取向 Cr2Te3 薄膜的结构、形态、磁和磁输运性质。条纹状 RHEED 图案表明在两种基底上都有平坦光滑的薄膜生长。STM 研究表明表面原子呈六边形排列。从原子分辨的 STM 图像确定晶格参数与体晶体结构一致。磁性测量表明该薄膜是铁磁的，居里温度约为 180 K，在 35 K 以下观察到类似自旋玻璃的行为。磁输运测量表明该薄膜具有金属性质，具有沿 c 轴的垂直磁各向异性。
