Jana S K, Saha B, Satpati B, Banerjee S
Surface Physics and Materials Science Division, Saha Institute of Nuclear Physics, 1/AF Bidhannagar, Saltlake, Kolkata: 700064, India.
Dalton Trans. 2015 May 21;44(19):9158-69. doi: 10.1039/c5dt01025j.
In this work we report the fabrication of both pristine Mn2O3 and Mn2O3-Au composite thin films on an indium tin oxide (ITO) substrate by a one-step novel co-electrodeposition technique. From the electron microscopy study, we observed that these two films are morphologically different. The main aim of this study is to understand the effect of the nanostructure and metal integration on the electrochemical charge storage properties of these two films. Since a charge storage mechanism is possible through faradic red-ox reaction and non-faradic double layered process, electrochemical characterization and frequency response analysis indicate better charge storage properties of the composite system over pristine Mn2O3. The Mott-Schottky analysis is used for the charge carrier estimation which provides the electronic properties of both the samples. Besides the mechanism of the co-electrodeposition technique, we also discuss in detail the material characterization of both pristine Mn2O3 and Mn2O3-Au composite samples using XRD, EELS and electron microscopy analysis. To the best of our knowledge, the electrochemical properties of the Mn2O3-Au composite sample are reported here for the first time.
在本工作中,我们报道了通过一种新颖的一步共电沉积技术在氧化铟锡(ITO)衬底上制备原始Mn2O3和Mn2O3 - Au复合薄膜。通过电子显微镜研究,我们观察到这两种薄膜在形态上有所不同。本研究的主要目的是了解纳米结构和金属整合对这两种薄膜电化学电荷存储性能的影响。由于通过法拉第氧化还原反应和非法拉第双层过程都可能存在电荷存储机制,电化学表征和频率响应分析表明复合体系比原始Mn2O3具有更好的电荷存储性能。Mott - Schottky分析用于电荷载流子估计,它提供了两个样品的电子性质。除了共电沉积技术的机制外,我们还使用XRD、EELS和电子显微镜分析详细讨论了原始Mn2O3和Mn2O3 - Au复合样品的材料表征。据我们所知,本文首次报道了Mn2O3 - Au复合样品的电化学性质。