1ex Dipartimento di Scienze della Terra (now Physics and Geology),Università di Perugia,06123 Perugia,Italy.
2Scientific and Technological Centers (CCiTUB),Universitat de Barcelona,Lluís Solé Sabarís 1-3,08028 Barcelona,Spain.
Microsc Microanal. 2015 Oct;21(5):1053-69. doi: 10.1017/S1431927615000409. Epub 2015 May 12.
The 50th anniversary of the application of electron probe microanalysis (EPMA) to the Earth Sciences provides an opportunity for an assessment of the state-of-the-art of the technique. Stemming from the introduction of the first automated instruments, the latest developments of EPMA and some typical applications are reviewed with an eye to the future. The most noticeable recent technical achievements such as the field-emission electron gun, the latest generation of energy and wavelength dispersive spectrometers, and the development of analytical methods based on new sets of first principle data obtained by the use of sophisticated computer codes, allow for the extension of the method to the analysis of trace elements, ultra-light elements (down to Li), small particles, and thin films, with a high degree of accuracy and precision and within a considerably reduced volume of interaction. A number of working examples and a thorough list of references provide the reader with a working knowledge of the capabilities and limitations of EPMA today.
电子探针微分析（EPMA）应用于地球科学 50 周年，为评估该技术的现状提供了一个机会。从第一台自动化仪器的引入开始，回顾了 EPMA 的最新发展和一些典型应用，着眼于未来。最近最引人注目的技术成就，如场发射电子枪、最新一代的能量和波长色散光谱仪，以及基于使用复杂计算机代码获得的新的第一性原理数据集开发的分析方法，使得该方法能够扩展到痕量元素、超轻元素（低至 Li）、小颗粒和薄膜的分析，具有高度的准确性和精密度，并且交互体积大大减小。许多工作实例和详尽的参考文献为读者提供了对 EPMA 当今能力和局限性的了解。
