Liao Chia-Chi, Lo Yu-Lung
Opt Express. 2015 Apr 20;23(8):10653-67. doi: 10.1364/OE.23.010653.
A method is proposed for extracting the linear birefringence (LB) and linear dichroism (LD) properties of an anisotropic optical sample using reflection-mode optical coherence tomography (OCT) and a hybrid Mueller matrix formalism. To ensure the accuracy of the extracted parameter values, a method is proposed for calibrating and compensating the polarization distortion effect induced by the beam splitters in the OCT system using a composite quarter-waveplate / half-waveplate / quarter-waveplate structure. The validity of the proposed method is confirmed by extracting the LB and LD properties of a quarter-wave plate and a defective polarizer. To the best of the authors' knowledge, the method proposed in this study represents the first reported attempt to utilize an inverse Mueller matrix formalism and a reflection-mode OCT structure to extract the LB and LD parameters of optically anisotropic samples.
提出了一种利用反射模式光学相干断层扫描(OCT)和混合穆勒矩阵形式来提取各向异性光学样品的线性双折射(LB)和线性二向色性(LD)特性的方法。为确保所提取参数值的准确性,提出了一种使用复合四分之一波片/半波片/四分之一波片结构来校准和补偿OCT系统中光束分离器引起的偏振畸变效应的方法。通过提取四分之一波片和有缺陷偏振器的LB和LD特性,证实了所提方法的有效性。据作者所知,本研究中提出的方法是首次报道的利用逆穆勒矩阵形式和反射模式OCT结构来提取光学各向异性样品的LB和LD参数的尝试。