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X射线衍射莫尔条纹特性的理论研究。I.

Theoretical study of the properties of X-ray diffraction moiré fringes. I.

作者信息

Yoshimura Jun-ichi

机构信息

Photon Factory, Institute of Materials Structure Science, High Energy Accelerator Research Organization, 1-1 Oho, Tsukuba, Ibaraki 305-0801, Japan.

出版信息

Acta Crystallogr A Found Adv. 2015 Jul;71(Pt 4):368-81. doi: 10.1107/S2053273315004970. Epub 2015 May 14.

Abstract

A detailed and comprehensive theoretical description of X-ray diffraction moiré fringes for a bicrystal specimen is given on the basis of a calculation by plane-wave dynamical diffraction theory. Firstly, prior to discussing the main subject of the paper, a previous article [Yoshimura (1997). Acta Cryst. A53, 810-812] on the two-dimensionality of diffraction moiré patterns is restated on a thorough calculation of the moiré interference phase. Then, the properties of moiré fringes derived from the above theory are explained for the case of a plane-wave diffraction image, where the significant effect of Pendellösung intensity oscillation on the moiré pattern when the crystal is strained is described in detail with theoretically simulated moiré images. Although such plane-wave moiré images are not widely observed in a nearly pure form, knowledge of their properties is essential for the understanding of diffraction moiré fringes in general.

摘要

基于平面波动力学衍射理论的计算,给出了双晶样品X射线衍射莫尔条纹的详细而全面的理论描述。首先,在讨论本文的主要主题之前,在对莫尔干涉相位进行深入计算的基础上,重述了之前一篇关于衍射莫尔条纹二维性的文章[吉村(1997年)。《晶体学报》A53,810 - 812]。然后,针对平面波衍射图像的情况,解释了从上述理论导出的莫尔条纹的性质,在理论模拟的莫尔图像中详细描述了晶体应变时彭德洛申强度振荡对莫尔条纹的显著影响。尽管这种平面波莫尔图像并非以近乎纯粹的形式广泛观测到,但了解它们的性质对于总体上理解衍射莫尔条纹至关重要。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/355f/4487425/175fe9858e50/a-71-00368-fig1.jpg

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