Yu Xiaoming, Robertson John
Engineering Dept, University of Cambridge, Cambridge CB2 1PZ, UK.
Sci Rep. 2015 Jul 29;5:12612. doi: 10.1038/srep12612.
We study the switching process in chalcogenide superlattice (CSL) phase-change memory materials by describing the motion of an atomic layer between the low and high resistance states. Two models have been proposed by different groups based on high-resolution electron microscope images. Model 1 proposes a transition from Ferro to Inverted Petrov state. Model 2 proposes a switch between Petrov and Inverted Petrov states. For each case, we note that the main transition is actually a vertical displacement of a Ge layer through a Te layer, followed by a lateral motion of GeTe sublayer to the final, low energy structure. Through calculating energy barriers, the rate-determining step is the displacive transition.
我们通过描述原子层在低电阻态和高电阻态之间的运动,研究了硫族化物超晶格(CSL)相变存储材料中的开关过程。不同的研究团队基于高分辨率电子显微镜图像提出了两种模型。模型1提出从铁电态到反彼得罗夫态的转变。模型2提出彼得罗夫态和反彼得罗夫态之间的转换。对于每种情况,我们注意到主要转变实际上是锗层通过碲层的垂直位移,随后是锗碲子层向最终低能量结构的横向运动。通过计算能垒,速率决定步骤是位移转变。