Kim Hyo Jung, Lee Hyun Hwi, Park Byung-Gyu
J Nanosci Nanotechnol. 2015 Jan;15(1):317-20. doi: 10.1166/jnn.2015.8332.
We measured the real-time variations in the nanostructure of organic (P3HT:PCBM) films and the interfacial structure between the electrode and an organic layer during thermal annealing using in-situ X-ray scattering measurements. An in-situ annealing system is valuable for investigating the nanostructures of organic thin films by simultaneously measuring the X-ray reflectivity and the grazing incidence wide-angle X-ray scattering profile. The interface between a Ca electrode and a P3HT:PCBM film began to degrade at 90 degrees C; however, thermal degradation could be prevented by a pre-annealing process prior to the metal deposition step. Device performance measurements revealed that the interface degradation could explain why organic photovoltaic devices with Ca electrodes performed poorly after an annealing process.
我们使用原位X射线散射测量法，测量了热退火过程中有机（P3HT:PCBM）薄膜纳米结构的实时变化以及电极与有机层之间的界面结构。原位退火系统对于通过同时测量X射线反射率和掠入射广角X射线散射轮廓来研究有机薄膜的纳米结构非常有价值。Ca电极与P3HT:PCBM薄膜之间的界面在90摄氏度时开始降解；然而，在金属沉积步骤之前的预退火过程可以防止热降解。器件性能测量表明，界面降解可以解释为什么具有Ca电极的有机光伏器件在退火过程后性能不佳。
