强脉冲电子束的红外成像诊断

Infrared imaging diagnostics for intense pulsed electron beam.

作者信息

Yu Xiao, Shen Jie, Qu Miao, Liu Wenbin, Zhong Haowen, Zhang Jie, Yan Sha, Zhang Gaolong, Le Xiaoyun

机构信息

School of Physics and Nuclear Energy Engineering, Beihang University, Beijing 100191, People's Republic of China.

Institute of Heavy Ion Physics, Peking University, Beijing 100871, People's Republic of China.

出版信息

Rev Sci Instrum. 2015 Aug;86(8):083305. doi: 10.1063/1.4928069.

DOI:10.1063/1.4928069

PMID:26329179

Abstract

Infrared imaging diagnostic method for two-dimensional calorimetric diagnostics has been developed for intense pulsed electron beam (IPEB). By using a 100-μm-thick tungsten film as the infrared heat sink for IPEB, the emitting uniformity of the electron source can be analyzed to evaluate the efficiency and stability of the diode system. Two-dimensional axisymmetric finite element method heat transfer simulation, combined with Monte Carlo calculation, was performed for error estimation and optimization of the method. The test of the method was finished with IPEB generated by explosive emission electron diode with pulse duration (FWHM) of 80 ns, electron energy up to 450 keV, and a total beam current of over 1 kA. The results showed that it is possible to measure the cross-sectional energy density distribution of IPEB with energy sensitivity of 0.1 J/cm(2) and spatial resolution of 1 mm. The technical details, such as irradiation protection of bremsstrahlung γ photons and the functional extensibility of the method were discussed in this work.

摘要

针对强脉冲电子束（IPEB），开发了用于二维量热诊断的红外成像诊断方法。通过使用厚度为100μm的钨膜作为IPEB的红外热沉，可以分析电子源的发射均匀性，以评估二极管系统的效率和稳定性。进行了二维轴对称有限元法传热模拟，并结合蒙特卡罗计算，用于误差估计和方法优化。该方法的测试是利用爆炸发射电子二极管产生的IPEB完成的，脉冲持续时间（半高宽）为80 ns，电子能量高达450 keV，总束流超过1 kA。结果表明，能够测量IPEB的横截面能量密度分布，能量灵敏度为0.1 J/cm²，空间分辨率为1 mm。本文讨论了该方法的技术细节，如韧致辐射γ光子的辐照防护以及该方法的功能扩展性。