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单根 InAs 纳米线/硅异质结中的光电流。

Photocurrents in a Single InAs Nanowire/Silicon Heterojunction.

机构信息

Walter Schottky Institut and Physik-Department, Technische Universität München , Am Coulombwall 4a, 85748 Garching, Germany.

Nanosystems Initiative Munich (NIM) , Schellingstr. 4, 80799 Munich, Germany.

出版信息

ACS Nano. 2015 Oct 27;9(10):9849-58. doi: 10.1021/acsnano.5b03017. Epub 2015 Sep 11.

Abstract

We investigate the optoelectronic properties of single indium arsenide nanowires, which are grown vertically on p-doped silicon substrates. We apply a scanning photocurrent microscopy to study the optoelectronic properties of the single heterojunctions. The measured photocurrent characteristics are consistent with an excess charge carrier transport through midgap trap states, which form at the Si/InAs heterojunctions. Namely, the trap states add an additional transport path across a heterojunction, and the charge of the defects changes the band bending at the junction. The bending gives rise to a photovoltaic effect at a small bias voltage. In addition, we observe a photoconductance effect within the InAs nanowires at large biases.

摘要

我们研究了垂直生长在 p 型掺杂硅衬底上的单个砷化铟纳米线的光电性质。我们应用扫描光电电流显微镜研究了单个异质结的光电性质。测量的光电电流特性与通过在 Si/InAs 异质结处形成的带隙中间陷阱态的过剩电荷载流子输运一致。也就是说,陷阱态在异质结上增加了额外的输运路径,而缺陷的电荷改变了结处的能带弯曲。这种弯曲在小偏压下产生光伏效应。此外,我们在大偏压下观察到了 InAs 纳米线中的光电导效应。

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