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使用自感应压电驱动对压电管扫描仪进行主动阻尼

Active Damping of a Piezoelectric Tube Scanner using Self-Sensing Piezo Actuation.

作者信息

Kuiper S, Schitter G

机构信息

Delft Center for Systems and Control, Precision and Microsystems Engineering, Delft University of Technology, Mekelweg 2, 2628CD, Delft, The Netherlands.

Delft Center for Systems and Control, Precision and Microsystems Engineering, Delft University of Technology, Mekelweg 2, 2628CD, Delft, The Netherlands. ; Automation and Control Institute, Vienna University of Technology, Gusshausstrasse 27-29, 1040 Vienna, Austria.

出版信息

Mechatronics (Oxf). 2010 Sep;20(6):656-665. doi: 10.1016/j.mechatronics.2010.07.003.

Abstract

In most Atomic Force Microscopes (AFM), a piezoelectric tube scanner is used to position the sample underneath the measurement probe. Oscillations stemming from the weakly damped resonances of the tube scanner are a major source of image distortion, putting a limitation on the achievable imaging speed. This paper demonstrates active damping of these oscillations in multiple scanning axes without the need for additional position sensors. By connecting the tube scanner in a capacitive bridge circuit the scanner oscillations can be measured in both scanning axes, using the same piezo material as an actuator and sensor simultaneously. In order to compensate for circuit imbalance caused by hysteresis in the piezo element, an adaptive balancing circuit is used. The obtained measurement signal is used for feedback control, reducing the resonance peaks in both scanning axes by 18 dB and the cross-coupling at those frequencies by 30 dB. Experimental results demonstrate a significant reduction in scanner oscillations when applying the typical triangular scanning signals, as well as a strong reduction in coupling induced oscillations. Recorded AFM images show a considerable reduction in image distortion due to the proposed control method, enabling artifact free AFM imaging at a speed of 122 lines per second with a standard piezoelectric tube scanner.

摘要

在大多数原子力显微镜(AFM)中,压电管扫描仪用于将样品放置在测量探头下方。管扫描仪弱阻尼共振产生的振荡是图像失真的主要来源,限制了可实现的成像速度。本文展示了在无需额外位置传感器的情况下,对多个扫描轴上的这些振荡进行主动阻尼。通过将管扫描仪连接到电容桥电路中,可以在两个扫描轴上测量扫描仪的振荡,同时使用相同的压电材料作为致动器和传感器。为了补偿压电元件滞后引起的电路不平衡,使用了自适应平衡电路。获得的测量信号用于反馈控制,将两个扫描轴上的共振峰值降低了18 dB,将这些频率下的交叉耦合降低了30 dB。实验结果表明,当应用典型的三角扫描信号时,扫描仪振荡显著降低,耦合引起的振荡也大幅减少。记录的AFM图像显示,由于所提出的控制方法,图像失真显著减少,使用标准压电管扫描仪能够以每秒122行的速度进行无伪影的AFM成像。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/8885/4583213/0dd8da2ae404/nihms224374f1.jpg

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本文引用的文献

1
Simultaneous sensing and actuation with a piezoelectric tube scanner.
Rev Sci Instrum. 2008 Jul;79(7):073702. doi: 10.1063/1.2952506.
2
Applied physics. High-speed atomic force microscopy.应用物理学。高速原子力显微镜。
Science. 2006 Oct 27;314(5799):601-2. doi: 10.1126/science.1133497.
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A high-speed atomic force microscope for studying biological macromolecules.一种用于研究生物大分子的高速原子力显微镜。
Proc Natl Acad Sci U S A. 2001 Oct 23;98(22):12468-72. doi: 10.1073/pnas.211400898. Epub 2001 Oct 9.
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Atomic force microscope.原子力显微镜
Phys Rev Lett. 1986 Mar 3;56(9):930-933. doi: 10.1103/PhysRevLett.56.930.

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