Li Shi-yuan, Zhang Guang-cai, Teng Ai-ping
Guang Pu Xue Yu Guang Pu Fen Xi. 2015 May;35(5):1432-5.
The radiation spectrum from the plasmas contains a large amount of information of plasmas. Thus, one of the most effective methods to detecting the plasma parameters is measure the plasma radiation spectrum. Until now, since the restriction of the Toshiba mechanically ruled aberration-corrected concave gratings, the measurable wavelength range of the incidence flat-field grazing spectrometer in the soft X-ray range are only from 5 to 40 nm. In order to extend the wavelength rang of grazing incidence flat-field spectrometer, first, a grazing incidence concave reflection grating ray-trace code is written using optical path equation. Second, under the same conditions with reference 6, we compare our numerical results with Harada's results. The results show that our results agree very well with the results of Harada. The results of comparison show that our ray-trace code is believable. Finally, the variety of the flat-field curves are detailedly investigated using the ray-trace code with the different grazing incidence conditions. The results show that the measurable wavelength range of the incidence flat-field grazing spectrometer are extended to 580 nm from the soft X-ray wavelength range of 540 nm. This result theoretically demonstrates the possibility of expanded the traditional band flat-field grazing incidence spectrometer from soft X-ray band to the extreme ultraviolet (XUV), and also bring a new design ideas for improving the use of grazing incidence flat field concave grating.
等离子体的辐射光谱包含大量有关等离子体的信息。因此，检测等离子体参数最有效的方法之一是测量等离子体辐射光谱。到目前为止，由于东芝机械刻划像差校正凹面光栅的限制，软X射线范围内入射平场掠射光谱仪的可测量波长范围仅为5至40纳米。为了扩展掠入射平场光谱仪的波长范围，首先，利用光路方程编写了掠入射凹面反射光栅光线追迹程序。其次，在与参考文献6相同的条件下，将我们的数值结果与原田的结果进行比较。结果表明，我们的结果与原田的结果非常吻合。比较结果表明我们的光线追迹程序是可信的。最后，利用该光线追迹程序详细研究了不同掠入射条件下平场曲线的变化情况。结果表明，入射平场掠射光谱仪的可测量波长范围从软X射线波段的5至40纳米扩展到了5至80纳米。这一结果从理论上证明了将传统波段平场掠入射光谱仪从软X射线波段扩展到极紫外（XUV）波段的可能性，也为改进掠入射平场凹面光栅的应用带来了新的设计思路。
