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二硅四卤化物平面构型中的对称性破缺:赝 Jahn-Teller 效应参数、硬度和电负性

Symmetry breaking in the planar configurations of disilicon tetrahalides: Pseudo-Jahn-Teller effect parameters, hardness and electronegativity.

作者信息

Kouchakzadeh Ghazaleh, Nori-Shargh Davood

机构信息

Department of Chemistry, Arak Branch, Islamic Azad University, Arak, Iran.

出版信息

Phys Chem Chem Phys. 2015 Nov 21;17(43):29251-61. doi: 10.1039/c5cp04216j.

Abstract

CCSD(T), MP2, LC-BLYP, LC-ωPBE and B3LYP methods with the Def2-TZVPP basis set and natural bond orbital (NBO) interpretations were performed to investigate the correlations between the Pseudo-Jahn-Teller Effect (PJTE) parameters [i.e. vibronic coupling constant values (F), energy gaps between reference states (Δ) and the primary force constant (K0)], structural and configurational properties, global hardness, global electronegativity, natural bond orders, stabilization energies associated with electron delocalizations and natural atomic charges of disilicon tetrafluoride (1), disilicon tetrachloride (2), disilicon tetrabromide (3) and disilicon tetraiodide (4). All levels of theory showed the trans-bent (C2h) configurations as the energy minimum structures of compounds 1-4, and the flap angles between the X2Si planes and the Si=Si bonds in the distorted (C2h) configurations decrease from compound 1 to compound 4. The negative curvatures of the ground state electronic configurations and the positive curvatures of the excited states of the adiabatic potential energy surfaces (APESs) which resulted from the mixing of the ground Ag and excited B2g states are due to the PJTE (i.e. PJT(Ag + B2g) ⊗ b2g problem). Contrary to the usual expectation, with the decrease of the energy gaps between reference states (Δ), the PJTE stabilization energy, E(PJT), decreases from compound 1 to compound 4. The canonical molecular orbital (CMO) analysis revealed that the contributions of the ψ(HOMO)(b3u) and ψL(UMO)(b1u) molecular orbitals in the vibronic coupling constant (F) decrease from compound 1 to compound 4. This fact clearly justifies the decrease of the vibronic coupling constant (F) and the primary force constant (the force constant without the PJTE) values on going from compound 1 to compound 4, leading to the decrease of the negative curvatures of the ground state electronic configuration curves of their corresponding APESs. The results obtained showed that the stabilization energies associated with the mixing of the distorted donor π(Si-Si)(b(u)) bonding and acceptor σ(Si-Si)*(b(u)) antibonding orbitals along the b2g bending distortions decrease from compound 1 to compound 4. This fact reasonably explains the increase of the Si-Si natural bond orders (nbo) on going from compound 1 to compound 4. With the increase of the Si-Si natural bond orders, the corresponding E(PJT) decreases from compound 1 to compound 4. Importantly, the variations of the global hardness (η) differences (Δ[η(C2h) - η(D2h)]) do not correlate with the trend observed for their corresponding total energy differences, justifying that the configurational properties of compounds 1-4 do not obey the maximum hardness principle. Interestingly, the trans-bent (C2h) configurations of compounds 1-4 are more electronegative than their corresponding planar (D2h) forms and the variations of their global electronegativity (χ) differences (Δ[χ(C2h) - χ(D2h)]) succeed in accounting for the decrease of the E(PJT) stabilization energies for the D2h → C2h conversion processes on going from compound 1 to compound 4.

摘要

采用CCSD(T)、MP2、LC - BLYP、LC - ωPBE和B3LYP方法,结合Def2 - TZVPP基组和自然键轨道(NBO)解释,研究了伪 Jahn - Teller效应(PJTE)参数[即振动耦合常数(F)、参考态之间的能隙(Δ)和初级力常数(K0)]、结构和构型性质、全局硬度、全局电负性、自然键序、与电子离域相关的稳定化能以及四氟化二硅(1)、四氯化二硅(2)、四溴化二硅(3)和四碘化二硅(4)的自然原子电荷之间的相关性。所有理论水平均表明,反式弯曲(C2h)构型是化合物1 - 4的能量最低结构,并且在扭曲的(C2h)构型中,X2Si平面与Si = Si键之间的襟翼角从化合物1到化合物4逐渐减小。基态电子构型的负曲率和绝热势能面(APESs)激发态的正曲率是由于基态Ag和激发态B2g的混合导致的,这归因于PJTE(即PJT(Ag + B2g) ⊗ b2g问题)。与通常的预期相反,随着参考态之间能隙(Δ)的减小,PJTE稳定化能E(PJT)从化合物1到化合物4逐渐降低。正则分子轨道(CMO)分析表明,振动耦合常数(F)中ψ(HOMO)(b3u)和ψL(UMO)(b1u)分子轨道的贡献从化合物1到化合物4逐渐减小。这一事实清楚地解释了从化合物1到化合物4振动耦合常数(F)和初级力常数(无PJTE的力常数)值的降低,导致其相应APESs基态电子构型曲线负曲率的减小。所得结果表明,沿着b2g弯曲畸变,与扭曲的供体π(Si - Si)(b(u))成键和受体σ(Si - Si)*(b(u))反键轨道混合相关联的稳定化能从化合物1到化合物4逐渐降低。这一事实合理地解释了从化合物1到化合物4时Si - Si自然键序(nbo)的增加。随着Si - Si自然键序的增加,相应的E(PJT)从化合物1到化合物4逐渐降低。重要的是,全局硬度(η)差异(Δ[η(C2h) - η(D2h)])的变化与其相应的总能量差异所观察到趋势不相关,这证明化合物1 - 4的构型性质不遵循最大硬度原理。有趣的是,化合物1 - 4的反式弯曲(C2h)构型比其相应的平面(D2h)形式更具电负性,并且它们全局电负性(χ)差异(Δ[χ(C2h) - χ(D2h)])的变化成功地解释了从化合物1到化合物4在D2h → C2h转化过程中E(PJT)稳定化能的降低。

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