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单个纳米线的热电和光电同时特性研究。

Simultaneous Thermoelectric and Optoelectronic Characterization of Individual Nanowires.

机构信息

Sandia National Laboratories , Livermore, California 94551, United States.

Department of Chemical & Materials Engineering, New Mexico State University , Las Cruces, New Mexico 88003, United States.

出版信息

Nano Lett. 2015 Dec 9;15(12):8129-35. doi: 10.1021/acs.nanolett.5b03572. Epub 2015 Nov 6.

DOI:10.1021/acs.nanolett.5b03572
PMID:26529491
Abstract

Semiconducting nanowires have been explored for a number of applications in optoelectronics such as photodetectors and solar cells. Currently, there is ample interest in identifying the mechanisms that lead to photoresponse in nanowires in order to improve and optimize performance. However, distinguishing among the different mechanisms, including photovoltaic, photothermoelectric, photoemission, bolometric, and photoconductive, is often difficult using purely optoelectronic measurements. In this work, we present an approach for performing combined and simultaneous thermoelectric and optoelectronic measurements on the same individual nanowire. We apply the approach to GaN/AlGaN core/shell and GaN/AlGaN/GaN core/shell/shell nanowires and demonstrate the photothermoelectric nature of the photocurrent observed at the electrical contacts at zero bias, for above- and below-bandgap illumination. Furthermore, the approach allows for the experimental determination of the temperature rise due to laser illumination, which is often obtained indirectly through modeling. We also show that under bias, both above- and below-bandgap illumination leads to a photoresponse in the channel with signatures of persistent photoconductivity due to photogating. Finally, we reveal the concomitant presence of photothermoelectric and photogating phenomena at the contacts in scanning photocurrent microscopy under bias by using their different temporal response. Our approach is applicable to a broad range of nanomaterials to elucidate their fundamental optoelectronic and thermoelectric properties.

摘要

半导体纳米线在光电领域的许多应用中都得到了探索,例如光电探测器和太阳能电池。目前,人们对确定导致纳米线光响应的机制非常感兴趣,目的是改善和优化性能。然而,仅使用光电测量来区分不同的机制(包括光伏、光热电、光发射、量热和光电导)通常很困难。在这项工作中,我们提出了一种在同一根纳米线上同时进行热电和光电测量的方法。我们将该方法应用于 GaN/AlGaN 核/壳和 GaN/AlGaN/GaN 核/壳/壳纳米线,并证明了在零偏压下,在带隙以上和以下的光照射下,在电接触处观察到的光电流具有光热电性质。此外,该方法允许实验确定由于激光照射引起的温升,这通常通过建模间接获得。我们还表明,在偏压下,带隙以上和以下的光照射都会导致通道中的光响应,其特征是由于光栅而产生的持久光电导。最后,我们通过使用它们不同的时间响应,揭示了在偏压下扫描光电流显微镜中接触处光热电和光栅现象的同时存在。我们的方法适用于广泛的纳米材料,以阐明它们的基本光电和热电性质。

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