具有分子筛能力的UiO-66金属有机框架薄膜的缺陷控制制备
Defect-Controlled Preparation of UiO-66 Metal-Organic Framework Thin Films with Molecular Sieving Capability.
作者信息
Zhang Caiqin, Zhao Yajing, Li Yali, Zhang Xuetong, Chi Lifeng, Lu Guang
机构信息
Jiangsu Key Laboratory for Carbon-Based Functional Materials & Devices, Institute of Functional Nano and Soft Materials (FUNSOM) and, Collaborative Innovation Center of Suzhou Nano Science and Technology, Soochow University, 199 Ren'ai Road, Suzhou Industrial Park, Suzhou, 215123, China.
Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, 398 Ruoshui Road, Suzhou Industrial Park, Suzhou, 215123, China.
出版信息
Chem Asian J. 2016 Jan;11(2):207-10. doi: 10.1002/asia.201501079. Epub 2015 Nov 16.
Metal-organic framework (MOF) UiO-66 thin films are solvothermally grown on conducting substrates. The as-synthesized MOF thin films are subsequently dried by a supercritical process or treated with polydimethylsiloxane (PDMS). The obtained UiO-66 thin films show excellent molecular sieving capability as confirmed by the electrochemical studies for redox-active species with different sizes.
金属有机框架（MOF）UiO-66薄膜通过溶剂热法生长在导电基底上。随后，将合成的MOF薄膜通过超临界过程干燥或用聚二甲基硅氧烷（PDMS）处理。如对不同尺寸的氧化还原活性物质进行的电化学研究所证实，所得的UiO-66薄膜具有出色的分子筛能力。
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