Solid State Physics Laboratory, ETH Zürich , CH-8093 Zürich, Switzerland.
Nano Lett. 2015 Dec 9;15(12):7994-9. doi: 10.1021/acs.nanolett.5b03170. Epub 2015 Nov 18.
We demonstrate a scanning gate grid measurement technique consisting in measuring the conductance of a quantum point contact (QPC) as a function of gate voltage at each tip position. Unlike conventional scanning gate experiments, it allows investigating QPC conductance plateaus affected by the tip at these positions. We compensate the capacitive coupling of the tip to the QPC and discover that interference fringes coexist with distorted QPC plateaus. We spatially resolve the mode structure for each plateau.
我们展示了一种扫描栅格测量技术，该技术包括在每个针尖位置测量作为栅极电压函数的量子点接触(QPC)的电导。与传统的扫描门实验不同，它允许研究受这些位置上的针尖影响的 QPC 电导平台。我们补偿了针尖与 QPC 的电容耦合，并发现干涉条纹与变形的 QPC 平台共存。我们对每个平台的模式结构进行了空间分辨。
