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非复杂性双侧分期脑深部电刺激术后C反应蛋白水平的时间变化

Chronological Changes of C-Reactive Protein Levels Following Uncomplicated, Two-Staged, Bilateral Deep Brain Stimulation.

作者信息

Kim Jae-Hun, Ha Sang-Woo, Choi Jin-Gyu, Son Byung-Chul

机构信息

Department of Neurosurgery, St. Mary's Hospital, College of Medicine, The Catholic University of Korea, Seoul, Korea.

Department of Neurosurgery, Chosun University Hospital, Chosum University College of Medicine, Gwangju, Korea.

出版信息

J Korean Neurosurg Soc. 2015 Oct;58(4):368-72. doi: 10.3340/jkns.2015.58.4.368. Epub 2015 Oct 30.

DOI:10.3340/jkns.2015.58.4.368
PMID:26587192
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC4651999/
Abstract

OBJECTIVE

The occurrence of acute cerebral infection following deep brain stimulation (DBS) is currently being reported with elevation of C-reactive protein (CRP) level. The aim of the present study was to establish normal range of the magnitude and time-course of CRP increases following routine DBS procedures in the absence of clinical and laboratory signs of infection.

METHODS

A retrospective evaluation of serial changes of plasma CRP levels in 46 patients undergoing bilateral, two-staged DBS was performed. Because DBS was performed as a two-staged procedure involving; implantation of lead and internal pulse generator (IPG), CRP was measured preoperatively and postoperatively every 2 days until normalization of CRP (post-lead implantation day 2 and 4, post-IPG implantation day 2, 4, and 6).

RESULTS

Compared with preoperative CRP levels (0.12±0.17 mg/dL, n=46), mean CRP levels were significantly elevated after lead insertion day 2 and 4 (1.68±1.83 mg/dL, n=46 and 0.76±0.38 mg/dL, n=16, respectively, p<0.001). The mean CRP levels at post-lead implantation day 2 were further elevated at post-IPG implantation day 2 (3.41±2.56 mg/dL, n=46, respectively, p<0.01). This elevation in post-IPG day 2 rapidly declined in day 4 (1.24±1.29 mg/dL, n=46, p<0.05) and normalized to preoperative value at day 6 (0.42±0.33 mg/dL, n=46, p>0.05). Mean CRP levels after IPG implantation were significantly higher in patients whose IPGs were implanted at post-lead day 3 than those at post-lead day 5-6 (3.99±2.80 mg/dL, n=30, and 2.31±1.56 mg/dL, n=16, respectively, p<0.05). However, there was no difference in post-IPG day 2 and 4 between them (p>0.05).

CONCLUSION

The mean postoperative CRP levels were highest on post-IPG insertion day 2 and decreased rapidly, returning to the normal range on post-IPG implantation day 6. The duration of post-lead implantation period influenced the magnitude of CRP elevation at post-IPG insertion day 2. Information about the normal response of CRP following DBS could help to avoid unnecessary diagnostic and therapeutic efforts.

摘要

目的

目前有报道称,深部脑刺激(DBS)后会发生急性脑感染,同时伴有C反应蛋白(CRP)水平升高。本研究的目的是确定在没有感染的临床和实验室迹象的情况下,常规DBS手术后CRP升高的幅度和时间进程的正常范围。

方法

对46例接受双侧、两阶段DBS的患者血浆CRP水平的系列变化进行回顾性评估。由于DBS是分两阶段进行的,包括植入电极和植入式脉冲发生器(IPG),因此在术前和术后每2天测量一次CRP,直至CRP恢复正常(电极植入后第2天和第4天、IPG植入后第2天、第4天和第6天)。

结果

与术前CRP水平(0.12±0.17mg/dL,n = 46)相比,电极插入后第2天和第4天的平均CRP水平显著升高(分别为1.68±1.83mg/dL,n = 46和0.76±0.38mg/dL,n = 16,p<0.001)。电极植入后第2天的平均CRP水平在IPG植入后第2天进一步升高(分别为3.41±2.56mg/dL,n = 46,p<0.01)。IPG植入后第2天的这种升高在第4天迅速下降(1.24±1.29mg/dL,n = 46,p<0.05),并在第6天恢复到术前值(0.42±0.33mg/dL,n = 46,p>0.05)。IPG在电极植入后第3天植入的患者,其IPG植入后的平均CRP水平显著高于在电极植入后第5 - 6天植入的患者(分别为3.99±2.80mg/dL, n = 30和2.31±1.56mg/dL, n = 16,p<0.05)。然而,两者在IPG植入后第2天和第4天没有差异(p>0.05)。

结论

术后平均CRP水平在IPG植入后第2天最高,并迅速下降,在IPG植入后第6天恢复到正常范围。电极植入后的持续时间影响IPG植入后第2天CRP升高的幅度。关于DBS后CRP正常反应的信息有助于避免不必要的诊断和治疗措施。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d496/4651999/198ad43d96c8/jkns-58-368-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d496/4651999/198ad43d96c8/jkns-58-368-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d496/4651999/198ad43d96c8/jkns-58-368-g001.jpg

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The risk of hardware infection in deep brain stimulation surgery is greater at impulse generator replacement than at the primary procedure.在深部脑刺激手术中,更换脉冲发生器时硬件感染的风险比初次手术时更高。
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