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用于超级电容器应用的金属掺杂氧化锰薄膜

Metal Doped Manganese Oxide Thin Films for Supercapacitor Application.

作者信息

Tung Mai Thanh, Thuy Hoang Thi Bich, Hang Le Thi Thu

出版信息

J Nanosci Nanotechnol. 2015 Sep;15(9):6949-56. doi: 10.1166/jnn.2015.10525.

Abstract

Co and Fe doped manganese oxide thin films were prepared by anodic deposition at current density of 50 mA cm(-2) using the electrolyte containing manganese sulfate and either cobalt sulfate or ferrous sulfate. Surface morphology and crystal structure of oxides were studied by scanning electron microscope (SEM) and X-ray diffraction (XRD). Chemical composition of materials was analyzed by X-ray energy dispersive spectroscope (EDS), iodometric titration method and complexometric titration method, respectively. Supercapacitive behavior of Co and Fe doped manganese oxide films were characterized by cyclic voltammetry (CV) and impedance spectroscopy (EIS). The results show that the doped manganese oxides are composed of nano fiber-like structure with radius of 5-20 nm and remain amorphous structure after heat treatment at 100 degrees C for 2 hours. The average valence of manganese increases from +3.808 to +3.867 after doping Co and from +3.808 to +3.846 after doping Fe. The doped manganese oxide film electrodes exhibited preferably ideal pseudo-capacitive behavior. The specific capacitance value of deposited manganese oxide reaches a maximum of 175.3 F/g for doping Co and 244.6 F/g for doping Fe. The thin films retained about 84% of the initial capacity even after 500 cycles of charge-discharge test. Doping Co and Fe decreases diffusion and charge transfer resistance of the films. The electric double layer capacitance and capacitor response frequency are increased after doping.

摘要

采用阳极沉积法,以含有硫酸锰以及硫酸钴或硫酸亚铁的电解液,在电流密度为50 mA cm(-2)的条件下制备了钴和铁掺杂的锰氧化物薄膜。通过扫描电子显微镜(SEM)和X射线衍射(XRD)研究了氧化物的表面形貌和晶体结构。分别采用X射线能量色散光谱仪(EDS)、碘量滴定法和络合滴定法分析了材料的化学成分。通过循环伏安法(CV)和阻抗谱(EIS)对钴和铁掺杂的锰氧化物薄膜的超级电容行为进行了表征。结果表明,掺杂的锰氧化物由半径为5-20 nm的纳米纤维状结构组成,在100℃下热处理2小时后仍保持非晶结构。掺杂钴后锰的平均价态从+3.808增加到+3.867,掺杂铁后从+3.808增加到+3.846。掺杂的锰氧化物薄膜电极表现出较好的理想赝电容行为。沉积的锰氧化物的比电容值在掺杂钴时达到最大值175.3 F/g,掺杂铁时达到244.6 F/g。即使经过第500次充放电测试,薄膜仍保留了约84%的初始容量。掺杂钴和铁降低了薄膜的扩散电阻和电荷转移电阻。掺杂后双电层电容和电容器响应频率增加。

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