Tong Chong, Yun Juhyung, Chen Yen-Jen, Ji Dengxin, Gan Qiaoqiang, Anderson Wayne A
Department of Electrical Engineering, The State University of New York at Buffalo , Buffalo, New York 14260-1920, United States.
Department of Electrical Engineering, Incheon National University , Yeonsu Incheon, 406772, Korea.
ACS Appl Mater Interfaces. 2016 Feb 17;8(6):3985-91. doi: 10.1021/acsami.5b11285. Epub 2016 Feb 3.
Here, we report an approach to realize highly transparent low resistance Al-doped ZnO (AZO) films for broadband transparent conductors. Thin Al films are deposited on ZnO surfaces, followed by thermal diffusion processes, introducing the Al doping into ZnO thin films. By utilizing the interdiffusion of Al, Zn, and O, the chemical state of Al on the surfaces can be converted to a fully oxidized state, resulting in a low sheet resistance of 6.2 Ω/sq and an excellent transparency (i.e., 96.5% at 550 nm and higher than 85% up to 2500 nm), which is superior compared with some previously reported values for indium tin oxide, solution processed AZO, and many transparent conducting materials using novel nanostructures. Such AZO films are also applied as transparent conducting layers for AZO/Si heterojunction solar cells, demonstrating their applications in optoelectronic devices.
在此,我们报道了一种实现用于宽带透明导体的高透明低电阻掺铝氧化锌(AZO)薄膜的方法。在氧化锌表面沉积薄铝膜,随后进行热扩散过程,将铝掺杂引入氧化锌薄膜中。通过利用铝、锌和氧的相互扩散,表面铝的化学状态可转变为完全氧化态,从而得到6.2Ω/sq的低方块电阻和优异的透明度(即在550nm处为96.5%,在高达2500nm时高于85%),这优于一些先前报道的氧化铟锡、溶液法制备的AZO以及许多使用新型纳米结构的透明导电材料的值。这种AZO薄膜还被用作AZO/硅异质结太阳能电池的透明导电层,展示了它们在光电器件中的应用。