Bayles Alexandra V, Squires Todd M, Helgeson Matthew E
Department of Chemical Engineering, University of California Santa Barbara, 3357 Engineering II, Santa Barbara, CA 93106, USA.
Soft Matter. 2016 Feb 28;12(8):2440-52. doi: 10.1039/c5sm02576a.
Differential dynamic microscopy (DDM) is an emerging technique to measure the ensemble dynamics of colloidal and complex fluid motion using optical microscopy in systems that would otherwise be difficult to measure using other methods. To date, DDM has successfully been applied to linear space invariant imaging modes including bright-field, fluorescence, confocal, polarised, and phase-contrast microscopy to study diverse dynamic phenomena. In this work, we show for the first time how DDM analysis can be extended to dark-field imaging, i.e. a linear space variant (LSV) imaging mode. Specifically, we present a particle-based framework for describing dynamic image correlations in DDM, and use it to derive a correction to the image structure function obtained by DDM that accounts for scatterers with non-homogeneous intensity distributions as they move within the imaging plane. To validate the analysis, we study the Brownian motion of gold nanoparticles, whose plasmonic structure allows for nanometer-scale particles to be imaged under dark-field illumination, in Newtonian liquids. We find that diffusion coefficients of the nanoparticles can be reliably measured by dark-field DDM, even under optically dense concentrations where analysis via multiple-particle tracking microrheology fails. These results demonstrate the potential for DDM analysis to be applied to linear space variant forms of microscopy, providing access to experimental systems unavailable to other imaging modes.
差分动态显微镜(DDM)是一种新兴技术,用于在其他方法难以测量的系统中,利用光学显微镜测量胶体和复杂流体运动的整体动力学。迄今为止,DDM已成功应用于线性空间不变成像模式,包括明场、荧光、共聚焦、偏振和相衬显微镜,以研究各种动态现象。在这项工作中,我们首次展示了如何将DDM分析扩展到暗场成像,即一种线性空间变体(LSV)成像模式。具体而言,我们提出了一个基于粒子的框架来描述DDM中的动态图像相关性,并使用它来推导对DDM获得的图像结构函数的校正,该校正考虑了散射体在成像平面内移动时强度分布不均匀的情况。为了验证该分析,我们研究了金纳米颗粒在牛顿液体中的布朗运动,其等离子体结构允许纳米级颗粒在暗场照明下成像。我们发现,即使在多粒子跟踪微流变学分析失败的光学密集浓度下,通过暗场DDM也能可靠地测量纳米颗粒的扩散系数。这些结果证明了DDM分析应用于线性空间变体形式显微镜技术的潜力,为其他成像模式无法访问的实验系统提供了途径。