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纤锌矿型III族氮化物三元合金中低损耗电子能量损失谱的密度泛函理论建模

Density Functional Theory Modeling of Low-Loss Electron Energy-Loss Spectroscopy in Wurtzite III-Nitride Ternary Alloys.

作者信息

Eljarrat Alberto, Sastre Xavier, Peiró Francesca, Estradé Sónia

机构信息

Laboratory of Electron NanoScopies,LENS-MIND-IN2UB,Departament d'Electrόnica,Universitat de Barcelona,Marti i Franqués 1,08028 Barcelona,Spain.

出版信息

Microsc Microanal. 2016 Jun;22(3):706-16. doi: 10.1017/S1431927616000106. Epub 2016 Feb 12.

DOI:10.1017/S1431927616000106
PMID:26868876
Abstract

In the present work, the dielectric response of III-nitride semiconductors is studied using density functional theory (DFT) band structure calculations. The aim of this study is to improve our understanding of the features in the low-loss electron energy-loss spectra of ternary alloys, but the results are also relevant to optical and UV spectroscopy results. In addition, the dependence of the most remarkable features with composition is tested, i.e. applying Vegard's law to band gap and plasmon energy. For this purpose, three wurtzite ternary alloys, from the combination of binaries AlN, GaN, and InN, were simulated through a wide compositional range (i.e., Al x Ga1-x N, In x Al1-x N, and In x Ga1-x N, with x=[0,1]). For this DFT calculations, the standard tools found in Wien2k software were used. In order to improve the band structure description of these semiconductor compounds, the modified Becke-Johnson exchange-correlation potential was also used. Results from these calculations are presented, including band structure, density of states, and complex dielectric function for the whole compositional range. Larger, closer to experimental values, band gap energies are predicted using the novel potential, when compared with standard generalized gradient approximation. Moreover, a detailed analysis of the collective excitation features in the dielectric response reveals their compositional dependence, which sometimes departs from a linear behavior (bowing). Finally, an advantageous method for measuring the plasmon energy dependence from these calculations is explained.

摘要

在本工作中,利用密度泛函理论(DFT)能带结构计算研究了III族氮化物半导体的介电响应。本研究的目的是增进我们对三元合金低损耗电子能量损失谱特征的理解,但结果也与光学和紫外光谱结果相关。此外,还测试了最显著特征随成分的依赖性,即将维加德定律应用于带隙和等离子体能量。为此,通过宽成分范围(即AlxGa1-xN、InxAl1-xN和InxGa1-xN,x=[0,1])模拟了由二元化合物AlN、GaN和InN组合而成的三种纤锌矿型三元合金。对于这些DFT计算,使用了Wien2k软件中的标准工具。为了改进这些半导体化合物的能带结构描述,还使用了修正的Becke-Johnson交换关联势。给出了这些计算的结果,包括整个成分范围内的能带结构、态密度和复介电函数。与标准广义梯度近似相比,使用新的势预测的带隙能量更大,更接近实验值。此外,对介电响应中集体激发特征的详细分析揭示了它们的成分依赖性,这种依赖性有时偏离线性行为(弯曲)。最后,解释了一种从这些计算中测量等离子体能量依赖性的有利方法。

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