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用于荧光样品高通量成像的平场校正

Flat field correction for high-throughput imaging of fluorescent samples.

作者信息

Kask Peet, Palo Kaupo, Hinnah Chris, Pommerencke Thora

机构信息

PerkinElmer Cellular Technologies Germany GmbH, Hamburg, Germany.

出版信息

J Microsc. 2016 Sep;263(3):328-40. doi: 10.1111/jmi.12404. Epub 2016 Mar 29.

Abstract

Vignetting of microscopic images impacts both the visual impression of the images and any image analysis applied to it. Especially in high-throughput screening high demands are made on an automated image analysis. In our work we focused on fluorescent samples and found that two profiles (background and foreground) for each imaging channel need to be estimated to achieve a sufficiently flat image after correction. We have developed a method which runs completely unsupervised on a wide range of assays. By adding a reliable internal quality control we mitigate the risk of introducing artefacts into sample images through correction. The method requires hundreds of images for the foreground profile, thus limiting its application to high-throughput screening where this requirement is fulfilled in routine operation.

摘要

显微图像的渐晕会影响图像的视觉效果以及应用于其上的任何图像分析。特别是在高通量筛选中,对自动化图像分析有很高的要求。在我们的工作中,我们专注于荧光样本,发现每个成像通道需要估计两个轮廓(背景和前景),以便在校正后获得足够平坦的图像。我们开发了一种在广泛的分析中完全无监督运行的方法。通过添加可靠的内部质量控制,我们降低了通过校正将伪像引入样本图像的风险。该方法需要数百张前景轮廓的图像,因此将其应用限制在常规操作中满足此要求的高通量筛选中。

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