Parigi Valentina, Perros Elodie, Binard Guillaume, Bourdillon Céline, Maître Agnès, Carminati Rémi, Krachmalnicoff Valentina, De Wilde Yannick
Opt Express. 2016 Apr 4;24(7):7019-27. doi: 10.1364/OE.24.007019.
We study the intensity spatial correlation function of optical speckle patterns above a disordered dielectric medium in the multiple scattering regime. The intensity distributions are recorded by scanning near-field optical microscopy (SNOM) with sub-wavelength spatial resolution at variable distances from the surface in a range which spans continuously from the near-field (distance ≪ λ) to the far-field regime (distance ≫ λ). The non-universal behavior at sub-wavelength distances reveals the connection between the near-field speckle pattern and the internal structure of the medium.
我们研究了处于多重散射 regime 的无序介电介质上方光学散斑图案的强度空间相关函数。强度分布通过扫描近场光学显微镜（SNOM）记录，在从近场（距离≪λ）到远场 regime（距离≫λ）连续跨越的范围内，以亚波长空间分辨率在距表面可变距离处进行记录。亚波长距离处的非通用行为揭示了近场散斑图案与介质内部结构之间的联系。
