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采用痕量元素预富集的ETV-ICP-AES法分析高纯二氧化锗

Analysis of high-purity germanium dioxide by ETV-ICP-AES with preliminary concentration of trace elements.

作者信息

Medvedev Nickolay S, Shaverina Anastasiya V, Tsygankova Alphiya R, Saprykin Anatoly I

机构信息

Nikolaev Institute of Inorganic Chemistry, Siberian Branch of Russian Academy of Sciences (NIIC SB RAS), 3, Acad. Lavrentiev Ave. Novosibirsk 630090, Russia.

Nikolaev Institute of Inorganic Chemistry, Siberian Branch of Russian Academy of Sciences (NIIC SB RAS), 3, Acad. Lavrentiev Ave. Novosibirsk 630090, Russia; Novosibirsk National Research State University, 2, Pirogova St., Novosibirsk 630090, Russia.

出版信息

Talanta. 2016 Aug 1;155:358-62. doi: 10.1016/j.talanta.2016.02.052. Epub 2016 Feb 23.

DOI:10.1016/j.talanta.2016.02.052
PMID:27216693
Abstract

The paper presents a combined technique of germanium dioxide analysis by inductively coupled plasma atomic emission spectrometry (ICP-AES) with preconcentration of trace elements by distilling off matrix and electrothermal (ETV) introduction of the trace elements concentrate into the ICP. Evaluation of metrological characteristics of the developed technique of high-purity germanium dioxide analysis was performed. The limits of detection (LODs) for 25 trace elements ranged from 0.05 to 20ng/g. The accuracy of proposed technique is confirmed by "added-found" («or spiking») experiment and comparing the results of ETV-ICP-AES and ICP-AES analysis of high purity germanium dioxide samples.

摘要

本文介绍了一种通过电感耦合等离子体原子发射光谱法(ICP-AES)分析二氧化锗的组合技术,该技术通过蒸馏去除基体对微量元素进行预富集,并通过电热蒸发(ETV)将微量元素浓缩物引入ICP。对所开发的高纯二氧化锗分析技术的计量特性进行了评估。25种微量元素的检测限范围为0.05至20ng/g。通过“添加-测定”(“或加标”)实验以及比较高纯二氧化锗样品的ETV-ICP-AES和ICP-AES分析结果,证实了所提技术的准确性。

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