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实现光子晶体表面轮廓的高精度,以在超薄膜结构中实现近 unity 的太阳能吸收。

Achieving an Accurate Surface Profile of a Photonic Crystal for Near-Unity Solar Absorption in a Super Thin-Film Architecture.

机构信息

The Future Chips Constellation and the Department of Physics, Applied Physics, and Astronomy, Rensselaer Polytechnic Institute , 110 Eighth Street, Troy, New York 12180, United States.

Department of Physics, University of Toronto , 60 St. George Street, Toronto, Ontario M5S 1A7, Canada.

出版信息

ACS Nano. 2016 Jun 28;10(6):6116-24. doi: 10.1021/acsnano.6b01875. Epub 2016 Jun 8.

Abstract

In this work, a teepee-like photonic crystal (PC) structure on crystalline silicon (c-Si) is experimentally demonstrated, which fulfills two critical criteria in solar energy harvesting by (i) its Gaussian-type gradient-index profile for excellent antireflection and (ii) near-orthogonal energy flow and vortex-like field concentration via the parallel-to-interface refraction effect inside the structure for enhanced light trapping. For the PC structure on 500-μm-thick c-Si, the average reflection is only ∼0.7% for λ = 400-1000 nm. For the same structure on a much thinner c-Si ( t = 10 μm), the absorption is near unity (A ∼ 99%) for visible wavelengths, while the absorption in the weakly absorbing range (λ ∼ 1000 nm) is significantly increased to 79%, comparing to only 6% absorption for a 10-μm-thick planar c-Si. In addition, the average absorption (∼94.7%) of the PC structure on 10 μm c-Si for λ = 400-1000 nm is only ∼3.8% less than the average absorption (∼98.5%) of the PC structure on 500 μm c-Si, while the equivalent silicon solid content is reduced by 50 times. Furthermore, the angular dependence measurements show that the high absorption is sustained over a wide angle range (θinc = 0-60°) for teepee-like PC structure on both 500 and 10-μm-thick c-Si.

摘要

在这项工作中,我们在晶体硅(c-Si)上实验性地展示了一种类似于圆锥形帐篷的光子晶体(PC)结构,该结构满足了太阳能收集的两个关键标准:(i)其高斯型梯度折射率分布实现了优异的抗反射性能,(ii)通过结构内部平行于界面的折射效应实现近乎正交的能量流和类涡旋场集中,从而增强了光捕获。对于厚度为 500μm 的 c-Si 上的 PC 结构,在 λ = 400-1000nm 范围内的平均反射率仅约为 0.7%。对于厚度更薄的 c-Si(t = 10μm)上的相同结构,在可见光波长范围内的吸收率接近 1(A∼99%),而在弱吸收范围(λ∼1000nm)的吸收率则显著增加到 79%,而对于 10μm 厚的平面 c-Si,吸收率仅为 6%。此外,对于 λ = 400-1000nm 的 10μm c-Si 上的 PC 结构,平均吸收率(∼94.7%)仅比 500μm c-Si 上的 PC 结构(∼98.5%)低约 3.8%,而等效硅固体含量则降低了 50 倍。此外,角度依赖性测量表明,在 500μm 和 10μm 厚的 c-Si 上的圆锥形帐篷状 PC 结构都在宽角度范围(θinc=0-60°)内保持了高吸收率。

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