Ontario Ministry of the Environment and Climate Change, 125 Resources Road, Etobicoke, Ontario M9P 3V6, Canada.
Department of Chemistry and Biochemistry, Duquesne University, 600 Forbes Avenue, Pittsburgh, PA 15282, USA.
Talanta. 2016 Aug 15;156-157:104-111. doi: 10.1016/j.talanta.2016.04.064. Epub 2016 May 4.
The reliable analysis of highly toxic hexavalent chromium, Cr(VI), at ultra-trace levels remains challenging, given its easy conversion to non-toxic trivalent chromium. This work demonstrates a novel analytical method to quantify Cr(VI) at low ngL(-1) concentration levels in environmental water samples by using speciated isotope dilution (SID) analysis and double-spiking with Cr(III) and Cr(VI) enriched for different isotopes. Ion chromatography tandem mass spectrometry (IC-MS/MS) was used for the analysis of Cr(VI) as HCrO4(-) → CrO3(-). Whereas the classical linear multipoint calibration (MPC) curve approach obtained a method detection limit (MDL) of 7ngL(-1) Cr(VI), the modified SID-MS method adapted from U. S. EPA 6800 allowed for the quantification of Cr(VI) with an MDL of 2ngL(-1) and provided results corrected for Cr(VI) loss occurred after sample collection. The adapted SID-MS approach proved to yield more accurate and precise results than the MPC method, allowed for compensation of Cr(VI) reduction during sample transportation and storage while eliminating the need for frequent external calibration. The developed method is a complementary tool to routinely used inductively-coupled plasma (ICP) MS and circumvents typically experienced interferences.
痕量水平下六价铬(Cr(VI))的可靠分析具有挑战性,因为其很容易转化为无毒的三价铬。本工作展示了一种新的分析方法,通过使用形态特异的同位素稀释(SID)分析和 Cr(III)和 Cr(VI)的双标注入,对环境水样中的 Cr(VI)进行定量分析,Cr(III)和 Cr(VI)的同位素丰度不同。离子色谱-串联质谱(IC-MS/MS)用于分析 HCrO4(-) → CrO3(-) 形式的 Cr(VI)。经典的线性多点校准(MPC)曲线方法得到的方法检测限(MDL)为 7ngL(-1) Cr(VI),而美国环保署 6800 号标准中修改后的 SID-MS 方法允许定量分析 Cr(VI),MDL 为 2ngL(-1),并提供了对收集后 Cr(VI)损失进行校正的结果。与 MPC 方法相比,适应后的 SID-MS 方法证明能提供更准确和更精确的结果,允许补偿样品运输和储存过程中 Cr(VI)的还原,同时消除了频繁外部校准的需要。所开发的方法是对常规使用的电感耦合等离子体质谱(ICP-MS)的补充工具,避免了通常遇到的干扰。