Gupta Rajeev, Kaplan Simon G
National Institute of Standards and Technology, Gaithersburg, MD 20899-8442.
J Res Natl Inst Stand Technol. 2003 Dec 1;108(6):429-37. doi: 10.6028/jres.108.037. Print 2003 Nov-Dec.
We have constructed a new facility at the National Institute of Standards and Technology (NIST) to measure the index of refraction of transmissive materials in the wavelength range from the visible to the vacuum ultraviolet. An etalon of the material is illuminated with synchrotron radiation, and the interference fringes in the transmittance spectrum are measured using a Fourier transform spectrometer. The refractive index of calcium fluoride, CaF2, has been measured from 600 nm to 175 nm and the resulting values agree with a traditional goniometric measurement to within 1 × 10(-5). The uncertainty in the index values is currently limited by the uncertainty in the thickness measurement of the etalon.
我们在美国国家标准与技术研究院(NIST)建造了一座新设施,用于测量透射材料在从可见光到真空紫外光波长范围内的折射率。用同步辐射照射该材料的标准具,并使用傅里叶变换光谱仪测量透射光谱中的干涉条纹。已经测量了氟化钙(CaF2)在600纳米至175纳米范围内的折射率,所得值与传统测角测量结果的误差在1×10^(-5)以内。目前,折射率值的不确定性受标准具厚度测量不确定性的限制。