Suppr超能文献

使用傅里叶变换光谱仪进行高精度紫外线折射率测量。

High Accuracy Ultraviolet Index of Refraction Measurements Using a Fourier Transform Spectrometer.

作者信息

Gupta Rajeev, Kaplan Simon G

机构信息

National Institute of Standards and Technology, Gaithersburg, MD 20899-8442.

出版信息

J Res Natl Inst Stand Technol. 2003 Dec 1;108(6):429-37. doi: 10.6028/jres.108.037. Print 2003 Nov-Dec.

Abstract

We have constructed a new facility at the National Institute of Standards and Technology (NIST) to measure the index of refraction of transmissive materials in the wavelength range from the visible to the vacuum ultraviolet. An etalon of the material is illuminated with synchrotron radiation, and the interference fringes in the transmittance spectrum are measured using a Fourier transform spectrometer. The refractive index of calcium fluoride, CaF2, has been measured from 600 nm to 175 nm and the resulting values agree with a traditional goniometric measurement to within 1 × 10(-5). The uncertainty in the index values is currently limited by the uncertainty in the thickness measurement of the etalon.

摘要

我们在美国国家标准与技术研究院(NIST)建造了一座新设施,用于测量透射材料在从可见光到真空紫外光波长范围内的折射率。用同步辐射照射该材料的标准具,并使用傅里叶变换光谱仪测量透射光谱中的干涉条纹。已经测量了氟化钙(CaF2)在600纳米至175纳米范围内的折射率,所得值与传统测角测量结果的误差在1×10^(-5)以内。目前,折射率值的不确定性受标准具厚度测量不确定性的限制。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1c90/4844516/6cba6cfa27ab/j86gupf1.jpg

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验