Staymates Jessica L, Staymates Matthew E, Lawrence Jeffrey
National Institute of Standards and Technology (NIST), 100 Bureau Drive, Mailstop 8371, Gaithersburg, MD 20899 USA.
Int J Ion Mobil Spectrom. 2016;19:41-49. doi: 10.1007/s12127-015-0185-9. Epub 2015 Nov 4.
Sample collection for Ion Mobility Spectrometry (IMS) analysis is typically completed by swiping a collection wipe over a suspect surface to collect trace residues. The work presented here addresses the need for a method to measure the collection efficiency performance of surface wipe materials as a function of the number of times a wipe is used to interrogate a surface. The primary purpose of this study is to investigate the effect of wipe reuse, i.e., the number of times a wipe is swiped across a surface, on the overall particle collection and IMS response. Two types of collection wipes (Teflon coated fiberglass and Nomex) were examined by swiping multiple times, ranging from 0 to 1000, over representative surfaces that are common to security screening environments. Particle collection efficiencies were determined by fluorescence microscopy and particle counting techniques, and were shown to improve dramatically with increased number of swiping cycles. Ion mobility spectrometry was used to evaluate the chemical response of known masses of explosives (deposited after reusing wipes) as a function of the wipe reuse number. Results show that chemical response can be negatively affected, and greatly depends upon the conditions of the surface in which the wipe is interrogating. For most parameters tested, the PCE increased after the wipe was reused several times. Swiping a dusty cardboard surface multiple times also caused an increase in particle collection efficiency but a decrease in IMS response. Scanning electron microscopy images revealed significant surface degradation of the wipes on dusty cardboard at the micrometer spatial scale level for Teflon coated wipes. Additionally, several samples were evaluated by including a seven second thermal desorption cycle at 235°C into each swipe sampling interval in order to represent the IMS heating cycle. Results were similar to studies conducted without this heating cycle, suggesting that the primary mechanism for wipe deterioration is mechanical rather than thermal.
用于离子迁移谱(IMS)分析的样本采集通常是通过在可疑表面擦拭采集拭子来收集微量残留物来完成的。本文介绍的工作满足了一种方法的需求,该方法用于测量表面擦拭材料的采集效率性能与擦拭表面次数之间的关系。本研究的主要目的是调查擦拭物重复使用的影响,即擦拭物在表面上擦拭的次数,对整体颗粒采集和IMS响应的影响。通过在安全筛查环境中常见的代表性表面上从0到1000次多次擦拭,对两种类型的采集拭子(涂有特氟龙的玻璃纤维和Nomex)进行了检查。通过荧光显微镜和颗粒计数技术确定颗粒采集效率,结果表明随着擦拭循环次数的增加,采集效率显著提高。离子迁移谱用于评估已知质量的炸药(在擦拭物重复使用后沉积)的化学反应与擦拭物重复使用次数的关系。结果表明,化学反应可能会受到负面影响,并且很大程度上取决于擦拭物所擦拭表面的条件。对于大多数测试参数,擦拭物重复使用几次后,颗粒采集效率(PCE)会提高。在尘土飞扬的硬纸板表面多次擦拭也会导致颗粒采集效率提高,但IMS响应降低。扫描电子显微镜图像显示,在微米空间尺度水平上,涂有特氟龙的擦拭物在尘土飞扬的硬纸板上表面有明显降解。此外,通过在每个擦拭采样间隔中加入235°C的7秒热脱附循环来评估几个样本,以代表IMS加热循环。结果与没有此加热循环的研究相似,表明擦拭物劣化的主要机制是机械性的而非热性的。