Xiang Wenfeng, Wang Xin, Liu Yuan, Zhang JiaQi, Zhao Kun
State Key Laboratory of Heavy Oil Processing, China University of Petroleum, Beijing, 102249, China.
Beijing Key Laboratory of Optical Detection Technology for Oil and Gas, China University of Petroleum, Beijing, 102249, China.
Nanoscale Res Lett. 2016 Dec;11(1):337. doi: 10.1186/s11671-016-1551-1. Epub 2016 Jul 19.
A rapid technique is necessary to quantitatively detect the density of nanowire (NW) and nanotube arrays in one-dimensional devices which have been identified as useful building blocks for nanoelectronics, optoelectronics, biomedical devices, etc. Terahertz (THz) time-domain spectroscopy was employed in this research to detect the density of aligned Ni NW arrays. The transmitted amplitude of THz peaks and optical thickness of NW arrays was found to be the effective parameters to analyze the density change of NW arrays. Owing to the low multiple scattering and high order of Ni NW arrays, a linear relationship was observed for the transmitted amplitude and optical thickness regarding NW density, respectively. Therefore, THz technique may be used as a promising tool to characterize the density of one-dimensional structures in the large-scale integrated nanodevice fabrication.
对于一维器件中纳米线（NW）和纳米管阵列密度的定量检测，需要一种快速技术，这些一维器件已被视为纳米电子学、光电子学、生物医学器件等领域有用的构建模块。本研究采用太赫兹（THz）时域光谱技术来检测排列的镍纳米线阵列的密度。发现太赫兹峰的透射幅度和纳米线阵列的光学厚度是分析纳米线阵列密度变化的有效参数。由于镍纳米线阵列的多重散射较低且有序性较高，分别观察到透射幅度和光学厚度与纳米线密度之间存在线性关系。因此，太赫兹技术可作为一种有前景的工具，用于在大规模集成纳米器件制造中表征一维结构的密度。
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