Dutton Neale A W, Gyongy Istvan, Parmesan Luca, Henderson Robert K
STMicroelectronics Imaging Division, Pinkhill, Edinburgh EH12 7BF, UK.
CMOS Sensors and Systems Group, School of Engineering, The University of Edinburgh, Edinburgh EH9 3JL, UK.
Sensors (Basel). 2016 Jul 20;16(7):1122. doi: 10.3390/s16071122.
SPAD-based solid state CMOS image sensors utilising analogue integrators have attained deep sub-electron read noise (DSERN) permitting single photon counting (SPC) imaging. A new method is proposed to determine the read noise in DSERN image sensors by evaluating the peak separation and width (PSW) of single photon peaks in a photon counting histogram (PCH). The technique is used to identify and analyse cumulative noise in analogue integrating SPC SPAD-based pixels. The DSERN of our SPAD image sensor is exploited to confirm recent multi-photon threshold quanta image sensor (QIS) theory. Finally, various single and multiple photon spatio-temporal oversampling techniques are reviewed.
基于单光子雪崩二极管（SPAD）并利用模拟积分器的固态互补金属氧化物半导体（CMOS）图像传感器已实现了深度亚电子读出噪声（DSERN），从而能够进行单光子计数（SPC）成像。本文提出了一种新方法，通过评估光子计数直方图（PCH）中单个光子峰的峰间距和宽度（PSW）来确定DSERN图像传感器中的读出噪声。该技术用于识别和分析基于SPAD的模拟积分SPC像素中的累积噪声。利用我们的SPAD图像传感器的DSERN来证实最近的多光子阈值量子图像传感器（QIS）理论。最后，对各种单光子和多光子时空过采样技术进行了综述。
