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用于并五苯薄膜晶体管的紫外光固化聚倍半硅氧烷栅极介电层的研究

Investigation of Ultraviolet Light Curable Polysilsesquioxane Gate Dielectric Layers for Pentacene Thin Film Transistors.

作者信息

Shibao Hideto, Nakahara Yoshio, Uno Kazuyuki, Tanaka Ichiro

出版信息

J Nanosci Nanotechnol. 2016 Apr;16(4):3327-31. doi: 10.1166/jnn.2016.12292.

Abstract

Polysilsesquioxane (PSQ) comprising 3-methacryloxypropyl groups was investigated as an ultraviolet (UV)-light curable gate dielectric-material for pentacene thin film transistors (TFTs). The surface of UV-light cured PSQ films was smoother than that of thermally cured ones, and the pentacene layers deposited on the UV-Iight cured PSQ films consisted of larger grains. However, carrier mobility of the TFTs using the UV-light cured PSQ films was lower than that of the TFTs using the thermally cured ones. It was shown that the cross-linker molecules, which were only added to the UV-light cured PSQ films, worked as a major mobility-limiting factor for the TFTs.

摘要

研究了含3-甲基丙烯酰氧基丙基的聚倍半硅氧烷(PSQ)作为用于并五苯薄膜晶体管(TFT)的紫外(UV)光固化栅极介电材料。UV光固化PSQ薄膜的表面比热固化薄膜的表面更光滑,并且沉积在UV光固化PSQ薄膜上的并五苯层由更大的晶粒组成。然而,使用UV光固化PSQ薄膜的TFT的载流子迁移率低于使用热固化薄膜的TFT的载流子迁移率。结果表明,仅添加到UV光固化PSQ薄膜中的交联剂分子是TFT迁移率的主要限制因素。

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