Liu Tao, Yang Shuming, Jiang Zhuangde
Opt Express. 2016 Jul 25;24(15):16297-308. doi: 10.1364/OE.24.016297.
Planar multi-annular nanostructured metasurfaces have provided a new way to realize far-field optical super-resolution focusing and nanoscopic imaging, due to the delicate interference of propagating waves diffracted from the metasurface mask. However, so far there are no proper methods that can be used to essentially interpret the super-focusing and nano-imaging mechanisms. This research proposes an electromagnetic methodology for the super-resolution investigation of nanostructured metasurfaces. We have physically modeled the polarization-dependent transmission effect of the subwavelength nanostructure and the vectorial imaging process of a high-numerical-aperture microscopic system. We have found theoretically and experimentally that the current design theories may produce imprecise results; the microscopic imaging experimental method can only detect transversely polarized electric field component and cannot map out three-dimensional total electric energy density distribution behind metasurfaces. This method will potentially be used in far-field nanoscopy, nanolithography, high-density optical storage, etc.
平面多环纳米结构超表面由于从超表面掩模衍射的传播波的精细干涉,为实现远场光学超分辨率聚焦和纳米成像提供了一种新方法。然而,到目前为止,还没有合适的方法能够从本质上解释超聚焦和纳米成像机制。本研究提出了一种用于纳米结构超表面超分辨率研究的电磁方法。我们对亚波长纳米结构的偏振相关透射效应和高数值孔径微观系统的矢量成像过程进行了物理建模。我们在理论和实验上发现,当前的设计理论可能会产生不精确的结果;微观成像实验方法只能检测横向偏振电场分量,无法绘制超表面后面的三维总电能密度分布。该方法有望应用于远场纳米显微镜、纳米光刻、高密度光存储等领域。