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无催化剂气相外延生长用于光收集的密集、规则 GaAs 纳米线阵列。

Dense, Regular GaAs Nanowire Arrays by Catalyst-Free Vapor Phase Epitaxy for Light Harvesting.

机构信息

Peter Grünberg Institute 9 (PGI 9) and JARA-Fundamentals of Future Information Technologies , Forschungszentrum Jülich, 52425 Jülich, Germany.

National Institute of Materials Physics , P.O. Box MG-7, Magurele, Bucharest 077125, Romania.

出版信息

ACS Appl Mater Interfaces. 2016 Aug 31;8(34):22484-92. doi: 10.1021/acsami.6b05581. Epub 2016 Aug 19.

Abstract

Density dependent growth and optical properties of periodic arrays of GaAs nanowires (NWs) by fast selective area growth MOVPE are investigated. As the period of the arrays is decreased from 500 nm down to 100 nm, a volume growth enhancement by a factor of up to four compared with the growth of a planar layer is observed. This increase is explained as resulting from increased collection of precursors on the side walls of the nanowires due to the gas flow redistribution in the space between the NWs. Normal spectral reflectance of the arrays is strongly reduced compared with a flat substrate surface in all fabricated arrays. Electromagnetic modeling reveals that this reduction is caused by antireflective action of the nanowire arrays and nanowire-diameter dependent light absorption. Irrespective of the periodicity and diameter, Raman scattering and grazing angle X-ray diffraction show signal from zinc blende and wurtzite phases, the latter originating from stacking faults as observed by high resolution transmission electron microscopy. Raman spectra contain intense surface phonons peaks, whose intensity depends strongly on the nanowire diameters as a result of potential structural changes and as well as variations of optical field distribution in the nanowires.

摘要

采用快速选择性区域气相外延生长法研究了 GaAs 纳米线(NWs)周期性阵列的密度依赖生长和光学性质。当阵列的周期从 500nm 减小到 100nm 时,与平面层生长相比,观察到体积生长增强了四倍。这种增加可以解释为由于纳米线之间空间中的气体流动重新分配,导致前驱物在纳米线侧壁上的收集增加。与制造的所有阵列中的平面基底表面相比,阵列的正常光谱反射率大大降低。电磁建模表明,这种减少是由纳米线阵列的抗反射作用和纳米线直径相关的光吸收引起的。无论周期性和直径如何,拉曼散射和掠角 X 射线衍射都显示出闪锌矿和纤锌矿相的信号,后者源自通过高分辨率透射电子显微镜观察到的位错。拉曼光谱包含强烈的表面声子峰,其强度强烈依赖于纳米线直径,这是由于潜在的结构变化以及纳米线中光场分布的变化。

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