Chung Wan-Ho, Kim Sang-Ho, Kim Hak-Sung
Department of Mechanical Convergence Engineering Hanyang University, 17 Haendang-Dong, Seongdong-Gu, Seoul 133-791 South Korea.
Nanotech and beyond Co., 125-10, Techno 2-ro, Yuseong-gu, Daejeon, 34024, South Korea.
Sci Rep. 2016 Aug 24;6:32086. doi: 10.1038/srep32086.
In this work, silver nanowire inks with hydroxypropyl methylcellulose (HPMC) binders were coated on polyethylene terephthalate (PET) substrates and welded via flash white light and ultraviolet C (UV-C) irradiation to produce highly conductive transparent electrodes. The coated silver nanowire films were firmly welded and embedded into PET substrate successfully at room temperature and under ambient conditions using an in-house flash white light welding system and UV-C irradiation. The effects of light irradiation conditions (light energy, irradiation time, pulse duration, and pulse number) on the silver nanowire networks were studied and optimized. Bending fatigue tests were also conducted to characterize the reliability of the welded transparent conductive silver nanowire films. The surfaces of the welded silver nanowire films were analyzed via scanning electron microscopy (SEM), while the transmittance of the structures was measured using a spectrophotometer. From the results, a highly conductive and transparent silver nanowire film with excellent reliability could be achieved at room temperature under ambient conditions via the combined flash white light and UV-C irradiation welding process.
在这项工作中,将含有羟丙基甲基纤维素(HPMC)粘合剂的银纳米线油墨涂覆在聚对苯二甲酸乙二酯(PET)基板上,并通过闪光白光和紫外线C(UV-C)照射进行焊接,以制备高导电性透明电极。使用内部闪光白光焊接系统和UV-C照射,在室温及环境条件下,成功地将涂覆的银纳米线薄膜牢固焊接并嵌入PET基板中。研究并优化了光照射条件(光能、照射时间、脉冲持续时间和脉冲数)对银纳米线网络的影响。还进行了弯曲疲劳测试,以表征焊接透明导电银纳米线薄膜的可靠性。通过扫描电子显微镜(SEM)分析焊接银纳米线薄膜的表面,同时使用分光光度计测量结构的透光率。结果表明,通过闪光白光和UV-C照射的组合焊接工艺,可在室温及环境条件下获得具有优异可靠性的高导电性透明银纳米线薄膜。