Institut de Bioenginyeria de Catalunya (IBEC), C/Baldiri i Reixac 11-15, E-08028, Barcelona, Spain. Departament d'Enginyeries: Electrònica, Universitat de Barcelona, C/Martí i Franqués 1, E-08028, Barcelona, Spain.
Nanotechnology. 2016 Oct 7;27(40):405706. doi: 10.1088/0957-4484/27/40/405706. Epub 2016 Sep 6.
Lift-mode electrostatic force microscopy (EFM) is one of the most convenient imaging modes to study the local dielectric properties of non-planar samples. Here we present the quantitative analysis of this imaging mode. We introduce a method to quantify and subtract the topographic crosstalk from the lift-mode EFM images, and a 3D numerical approach that allows for extracting the local dielectric constant with nanoscale spatial resolution free from topographic artifacts. We demonstrate this procedure by measuring the dielectric properties of micropatterned SiO2 pillars and of single bacteria cells, thus illustrating the wide applicability of our approach from materials science to biology.
抬举模式静电 force microscopy (EFM) 是最便捷的成像模式之一，用于研究非平面样品的局部介电性质。这里我们呈现对这种成像模式的定量分析。我们介绍了一种量化和减除抬举模式 EFM 图像中形貌串扰的方法，以及一种 3D 数值方法，该方法可以在无形貌伪影的情况下，以纳米级空间分辨率提取局部介电常数。我们通过测量 micropatterned SiO2 柱子和单个细菌细胞的介电性质，演示了这一过程，从而说明了我们的方法从材料科学到生物学的广泛适用性。
