Chen Zhaoyang, Zhao Xin, Lin Chengyou, Chen Shujing, Yin Liang, Ding Yingchun
Appl Opt. 2016 Sep 1;55(25):6832-5. doi: 10.1364/AO.55.006832.
By adding an absentee layer on the top of the metallic layer, the figure of merit (FOM) of a surface plasmon resonance (SPR) sensor with Kretschmann configuration was enhanced, without changing the resonance angle and the reflectance at the resonance angle. Comparing with a traditional SPR sensor, the FOM of the SPR sensor with an absentee layer composed of either 1367 nm thick KCl or 235 nm thick SiN can be improved by 5.53% or 11.41%, respectively. The enhancement of the FOM should be attributed to the faster decrease of the full width at half-maximum than the sensitivity after an absentee layer was applied in the SPR sensor.
通过在金属层顶部添加一个缺失层，在不改变共振角和共振角处反射率的情况下，具有Kretschmann结构的表面等离子体共振（SPR）传感器的品质因数（FOM）得到了提高。与传统的SPR传感器相比，由1367nm厚的KCl或235nm厚的SiN组成的缺失层的SPR传感器的FOM分别可以提高5.53%或11.41%。FOM的提高应归因于在SPR传感器中应用缺失层后，半高宽的下降速度比灵敏度快。
