High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei, Anhui 230031, China.
University of Science and Technology of China, Hefei, Anhui 230026, China.
Sci Rep. 2016 Sep 21;6:33873. doi: 10.1038/srep33873.
The semiconducting ferromagnet CrSiTe3 is a promising candidate for two-dimensional magnet simply by exfoliating down to single layers. To understand the magnetic behavior in thin-film samples and the possible applications, it is necessary to establish the nature of the magnetism in the bulk. In this work, the critical behavior at the paramagnetic to ferromagnetic phase transition in single-crystalline CrSiTe3 is investigated by bulk magnetization measurements. We have obtained the critical exponents (β = 0.170 ± 0.008, γ = 1.532 ± 0.001, and δ = 9.917 ± 0.008) and the critical temperature TC = 31.0 K using various techniques such as modified Arrott plot, Kouvel-Fisher plot, and critical isotherm analysis. Our analysis suggests that the determined exponents match well with those calculated from the results of renormalization group approach for a two-dimensional Ising model coupled with long-range interaction.
半导体铁磁体 CrSiTe3 通过剥离至单层是二维磁体的有前途的候选材料。为了了解薄膜样品中的磁行为和可能的应用，有必要确定体相中的磁性性质。在这项工作中，通过体磁化测量研究了单晶 CrSiTe3 中顺磁到铁磁相转变的临界行为。我们使用各种技术，如修正的 Arrott 图、Kouvel-Fisher 图和临界等温线分析，获得了临界指数（β=0.170±0.008，γ=1.532±0.001，δ=9.917±0.008）和临界温度 TC=31.0 K。我们的分析表明，确定的指数与重整化群方法对二维伊辛模型与长程相互作用耦合的结果计算出的指数非常吻合。
