School of Physics and CRANN, Trinity College Dublin, College Green, Dublin 2, Ireland.
Tyndall National Institute and School of Engineering, University College Cork, Lee Maltings, Prospect Row, Cork, Ireland.
Nanoscale. 2016 Oct 27;8(42):18170-18179. doi: 10.1039/c6nr05990b.
A range of seven different Ag plasmonic arrays formed using nanostructures of varying shape, size and gap were fabricated using helium-ion lithography (HIL) on an InGaN/GaN quantum well (QW) substrate. The influence of the array geometry on plasmon-enhanced Förster resonance energy transfer (FRET) from a single InGaN QW to a ∼80 nm layer of CdSe/ZnS quantum dots (QDs) embedded in a poly(methyl methacrylate) (PMMA) matrix is investigated. It is shown that the energy transfer efficiency is strongly dependent on the array properties and an efficiency of ∼51% is observed for a nanoring array. There were no signatures of FRET in the absence of the arrays. The QD acceptor layer emission is highly sensitive to the array geometry. A model was developed to confirm that the increase in the QD emission on the QW substrate compared with a GaN substrate can be attributed solely to plasmon-enhanced FRET. The individual contributions of direct enhancement of the QD layer emission by the array and the plasmon-enhanced FRET are separated out, with the QD emission described by the product of an array emission factor and an energy transfer factor. It is shown that while the nanoring geometry results in an energy transfer factor of ∼1.7 the competing quenching by the array, with an array emission factor of ∼0.7, results in only an overall gain of ∼14% in the QD emission. The QD emission was enhanced by ∼71% for a nanobox array, resulting from the combination of a more modest energy transfer factor of 1.2 coupled with an array emission factor of ∼1.4.
使用氦离子光刻 (HIL) 在 InGaN/GaN 量子阱 (QW) 衬底上制造了七种不同的 Ag 等离子体阵列,这些阵列使用了不同形状、大小和间隙的纳米结构。研究了阵列几何形状对单个 InGaN QW 到嵌入聚甲基丙烯酸甲酯 (PMMA) 基质中的约 80nm 厚 CdSe/ZnS 量子点 (QD) 的等离子体增强Förster 共振能量转移 (FRET) 的影响。结果表明,能量转移效率强烈依赖于阵列特性,对于纳米环阵列,观察到约 51%的能量转移效率。在没有阵列的情况下,没有 FRET 的迹象。QD 受体层发射对阵列几何形状非常敏感。开发了一个模型来证实与 GaN 衬底相比,QW 衬底上 QD 发射的增加可以仅归因于等离子体增强的 FRET。分离出了阵列对 QD 层发射的直接增强和等离子体增强 FRET 的单独贡献,其中 QD 发射由阵列发射因子和能量转移因子的乘积描述。结果表明,虽然纳米环几何形状导致能量转移因子约为 1.7,但由于阵列的竞争猝灭,其阵列发射因子约为 0.7,仅导致 QD 发射的总增益约为 14%。纳米盒阵列的 QD 发射增强了约 71%,这是由于能量转移因子 1.2 与阵列发射因子 1.4 的组合所致。