Hannonen Antti, Friberg Ari T, Setälä Tero
Opt Lett. 2016 Nov 1;41(21):4943-4946. doi: 10.1364/OL.41.004943.
We introduce a novel ghost reflection ellipsometer for a spectral characterization of homogeneous thin films and interfaces. The device makes use of a uniform, spatially incoherent, unpolarized light source with Gaussian statistics and of the detection of intensity correlations. Unlike traditional ellipsometers, no source or detector calibration and reference sample are needed. The method is also insensitive to instrumentation errors. The ellipsometer that we present here is a classical analog of a quantum twin-photon arrangement discussed earlier in the literature. However, the classical configuration is easier to implement and use, because entangled photon pairs are not needed and appropriate light sources and detectors are readily available.
我们介绍了一种新型的鬼反射椭圆偏振仪，用于对均匀薄膜和界面进行光谱表征。该设备利用具有高斯统计特性的均匀、空间非相干、非偏振光源，并检测强度相关性。与传统椭圆偏振仪不同，它不需要对光源或探测器进行校准，也不需要参考样品。该方法对仪器误差也不敏感。我们在此展示的椭圆偏振仪是文献中先前讨论的量子双光子装置的经典类似物。然而，经典配置更易于实现和使用，因为不需要纠缠光子对，并且易于获得合适的光源和探测器。
