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人类牙齿种植体在原子尺度上的骨-种植体界面。

The bone-implant interface of dental implants in humans on the atomic scale.

作者信息

Sundell Gustav, Dahlin Christer, Andersson Martin, Thuvander Mattias

机构信息

Department of Applied Physics, Chalmers University of Technology, SE-41296 Gothenburg, Sweden.

Department of Biomaterials, Institute of Clinical Sciences, Sahlgrenska Academy at the University of Gothenburg and the BIOMATCELL VINN Excellence Center of Biomaterials and Cell Therapy, SE-40530 Gothenburg, Sweden; Department of Oral & Maxillofacial Surgery, NU-hospital Organization, SE-461 73 Trollhättan, Sweden.

出版信息

Acta Biomater. 2017 Jan 15;48:445-450. doi: 10.1016/j.actbio.2016.11.044. Epub 2016 Nov 19.

DOI:10.1016/j.actbio.2016.11.044
PMID:27872014
Abstract

UNLABELLED

Osseointegration of dental implants occurs on a hierarchy of length scales down to the atomic level. A deeper understanding of the complex processes that take place at the surface of an implant on the smallest scale is of interest for the development of improved biomaterials. To date, transmission electron microscopy (TEM) has been utilized for examination of the bone-implant interface, providing details on the nanometer level. In this study we show that TEM imaging can be complemented with atom probe tomography (APT) to reveal the chemical composition of a Ti-based dental implant in a human jaw on the atomic level of resolution. As the atom probe technique has equal sensitivity for all elements, it allows for 3 dimensional characterizations of osseointegrated interfaces with unprecedented resolution. The APT reconstructions reveal a Ca-enriched zone in the immediate vicinity of the implant surface. A surface oxide of some 5nm thickness was measured on the titanium implant, with a sub-stoichiometric composition with respect to TiO. Minor incorporation of Ca into the thin oxide film was also evident. We conclude that the APT technique is capable of revealing chemical information from the bone-implant interface in 3D with unprecedented resolution, thus providing important insights into the mechanisms behind osseointegration.

STATEMENT OF SIGNIFICANCE

Osseointegration of dental implants occurs on a hierarchy of length scales down to the atomic level. A deeper understanding of the complex processes that take place at the surface of an implant on the smallest scale is of interest for the development of improved biomaterials. To date, transmission electron microscopy (TEM) has been utilized for examination of the bone-implant interface, providing details on the nanometer level. In this study we show that TEM imaging can be complemented with atom probe tomography (APT) to reveal the chemical composition of a Ti-based dental implant in a human jaw on the atomic level of resolution. Correlative microscopy ensures the accuracy of APT reconstructions and helps provide both chemical and structural information of the bone-implant interface on the smallest of length scales.

摘要

未标注

牙种植体的骨结合发生在从宏观到原子水平的一系列长度尺度上。深入了解在最小尺度下种植体表面发生的复杂过程,对于开发改进的生物材料具有重要意义。迄今为止,透射电子显微镜(TEM)已被用于检查骨-种植体界面,提供纳米级别的细节。在本研究中,我们表明TEM成像可以与原子探针断层扫描(APT)相结合,以在原子分辨率水平上揭示人类颌骨中钛基牙种植体的化学成分。由于原子探针技术对所有元素具有相同的灵敏度,它能够以前所未有的分辨率对骨结合界面进行三维表征。APT重建显示在种植体表面紧邻区域存在一个富钙区。在钛种植体上测量到约5nm厚的表面氧化物,其化学计量比相对于TiO不足。钙也少量掺入到薄氧化膜中。我们得出结论,APT技术能够以前所未有的分辨率从骨-种植体界面三维揭示化学信息,从而为骨结合背后的机制提供重要见解。

重要性声明

牙种植体的骨结合发生在从宏观到原子水平的一系列长度尺度上。深入了解在最小尺度下种植体表面发生的复杂过程,对于开发改进的生物材料具有重要意义。迄今为止,透射电子显微镜(TEM)已被用于检查骨-种植体界面,提供纳米级别的细节。在本研究中,我们表明TEM成像可以与原子探针断层扫描(APT)相结合,以在原子分辨率水平上揭示人类颌骨中钛基牙种植体的化学成分。相关显微镜技术确保了APT重建的准确性,并有助于在最小的长度尺度上提供骨-种植体界面的化学和结构信息。

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