Sander Dirk, Tian Zhen, Kirschner Jürgen
Max-Planck-Institut für Mikrostrukturphysik,Weinberg 2, D-06120 Halle, Germany.
Sensors (Basel). 2008 Jul 29;8(7):4466-4486. doi: 10.3390/s8074466.
We review the application of cantilever-based stress measurements in surface science and magnetism. The application of thin (thickness appr. 0.1 mm) single crystalline substrates as cantilevers has been used successfully to measure adsorbate-induced surface stress changes, lattice misfit induced film stress, and magneto-elastic stress of ferromagnetic monolayers. Surface stress changes as small as 0.01 N/m can be readily measured, and this translates into a sensitivity for adsorbate-coverage well below 0.01 of one layer. Stress as large as several GPa, beyond the elasticity limits of high strength materials, is measured, and it is ascribed to the lattice misfit between film and substrate. Our results point at the intimate relation between surface stress and surface reconstruction, stress-induced structural changes in epitaxially strained films, and strain-induced modifications of the magneto-elastic coupling in ferromagnetic monolayers.
我们回顾了基于悬臂梁的应力测量在表面科学和磁学中的应用。将薄（厚度约0.1毫米）的单晶衬底用作悬臂梁已成功用于测量吸附质引起的表面应力变化、晶格失配引起的薄膜应力以及铁磁单层的磁弹性应力。低至0.01 N/m的表面应力变化都能很容易地测量出来，这意味着对吸附质覆盖度的灵敏度远低于单层的0.01。测量到的应力高达数吉帕，超出了高强度材料的弹性极限，这归因于薄膜与衬底之间的晶格失配。我们的结果表明，表面应力与表面重构、外延应变薄膜中应力诱导的结构变化以及铁磁单层中应变诱导的磁弹性耦合变化之间存在密切关系。
