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小麦抗叶枯病基因的一个新图谱定位

A New Map Location of Gene for Resistance to Septoria Tritici Blotch in Wheat.

作者信息

Goodwin Stephen B, Cavaletto Jessica R, Hale Iago L, Thompson Ian, Xu Steven X, Adhikari Tika B, Dubcovsky Jorge

机构信息

Crop Production and Pest Control Research Unit, U.S. Department of Agriculture-Agricultural Research Service, Department of Botany and Plant Pathology, 915 West State Street, Purdue University, West Lafayette, IN 47907-2054, USA.

Department of Biological Sciences, University of New Hampshire, Durham, NH 03824, USA.

出版信息

Crop Sci. 2015 Jan-Feb;55(1):35-43. doi: 10.2135/cropsci2013.11.0766. Epub 2014 Oct 31.

Abstract

Septoria tritici blotch (STB), caused by (synonym: ; asexual stage: ), is an important disease of wheat worldwide. Management of the disease usually is by host resistance or fungicides. However, has developed insensitivity to most commonly applied fungicides so there is a continuing need for well-characterized sources of host resistance to accelerate the development of improved wheat cultivars. Gene has been a useful source of major resistance, but its mapping location has not been well characterized. Based on linkage to a single marker, a previous study assigned to a location on the short arm of chromosome 6D. However, the results from the present study show that this reported location is incorrect. Instead, linkage analysis revealed that is located on the short arm of wheat chromosome 7A, completely linked to microsatellite (SSR) locus and flanked by loci (12.4 cM distal) and (2.1 cM proximal). Linkage between and was validated in BCF progeny of other crosses, and analyses of the flanking markers with deletion stocks showed that the gene is located on 7AS between fraction lengths 0.73 and 0.83. This revised location of is different from those for other STB resistance genes previously mapped in hexaploid wheat but is approximately 20 cM proximal to an STB resistance gene mapped on the short arm of chromosome 7A in . The markers described in this study are useful for accelerating the deployment of in wheat breeding programs.

摘要

小麦叶枯病(STB)由(同义词:;无性阶段:)引起,是全球小麦的一种重要病害。该病的防治通常依靠寄主抗性或杀菌剂。然而,已经对大多数常用杀菌剂产生了不敏感性,因此持续需要特征明确的寄主抗性来源,以加速改良小麦品种的培育。基因一直是主要抗性的有用来源,但其定位尚未得到很好的表征。基于与单个标记的连锁关系,先前的一项研究将其定位在6D染色体短臂上的一个位置。然而,本研究结果表明该报道的位置是错误的。相反,连锁分析表明位于小麦7A染色体短臂上,与微卫星(SSR)位点完全连锁,并侧翼为位点(远端12. cM)和位点(近端2.1 cM)。在其他杂交组合的BCF后代中验证了与之间的连锁关系,并且用缺失系对侧翼标记进行分析表明该基因位于7AS上,片段长度在0.73和0.83之间。的这一修订位置与先前在六倍体小麦中定位的其他小麦叶枯病抗性基因的位置不同,但与中定位在7A染色体短臂上的一个小麦叶枯病抗性基因近端大约相距20 cM。本研究中描述的标记对于加速在小麦育种计划中的应用很有用。

相似文献

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A New Map Location of Gene for Resistance to Septoria Tritici Blotch in Wheat.小麦抗叶枯病基因的一个新图谱定位
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