Chemistry Department, KU Leuven, Celestijnenlaan 200F, 3001 Leuven, Belgium. Chemistry Department, University of Antwerp, Universiteitsplein 1, 2610 Antwerpen-Wilrijk, Belgium. imec, Kapeldreef 75, 3001 Leuven, Belgium.
Nanotechnology. 2017 Jan 27;28(4):04LT01. doi: 10.1088/1361-6528/aa510c. Epub 2016 Dec 15.
We present a method for area selective deposition of 2D WS nanoribbons with tunable thickness on a dielectric substrate. The process is based on a complete conversion of a pre-patterned, H-terminated Si layer to metallic W by WF, followed by in situ sulfidation by HS. The reaction process, performed at 450 °C, yields nanoribbons with lateral dimension down to 20 nm and with random basal plane orientation. The thickness of the nanoribbons is accurately controlled by the thickness of the pre-deposited Si layer. Upon rapid thermal annealing at 900 °C under inert gas, the WS basal planes align parallel to the substrate.
我们提出了一种在介电基底上选择性沉积二维 WS 纳米带的方法,该方法可以精确控制纳米带的厚度。该方法基于 WF 完全转化预先图案化的 H 终止 Si 层为金属 W,然后通过 HS 原位硫化。在 450°C 下进行反应,得到的纳米带的横向尺寸低至 20nm,且具有任意基面取向。纳米带的厚度可以通过预先沉积的 Si 层的厚度来精确控制。在惰性气体下快速热退火至 900°C 时,WS 基面平行于基底排列。