Terentyev Sergey, Blank Vladimir, Kolodziej Tomasz, Shvyd'ko Yuri
Technological Institute for Superhard and Novel Carbon Materials, 142190 Troitsk, Russian Federation.
Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA.
Rev Sci Instrum. 2016 Dec;87(12):125117. doi: 10.1063/1.4973326.
We report on the manufacturing and X-ray tests of bent diamond-crystal X-ray spectrographs, designed for noninvasive diagnostics of the X-ray free-electron laser (XFEL) spectra in the spectral range from 5 to 15 keV. The key component is a curved, 20-μm thin, single crystalline diamond triangular plate in the (110) orientation. The radius of curvature can be varied between R = 0.6 m and R = 0.1 m in a controlled fashion, ensuring imaging in a spectral window of up to 60 eV for ≃8 keV X-rays. All of the components of the bending mechanism (about 10 parts) are manufactured from diamond, thus ensuring safe operations in intense XFEL beams. The spectrograph is transparent to 88% for 5-keV photons and to 98% for 15-keV photons. Therefore, it can be used for noninvasive diagnostics of the X-ray spectra during XFEL operations.
我们报告了弯曲金刚石晶体X射线光谱仪的制造和X射线测试情况，该光谱仪旨在对5至15 keV光谱范围内的X射线自由电子激光（XFEL）光谱进行非侵入式诊断。关键部件是一块弯曲的、20μm厚、（110）取向的单晶金刚石三角板。曲率半径可在R = 0.6 m至R = 0.1 m之间以可控方式变化，确保对≃8 keV的X射线在高达60 eV的光谱窗口内成像。弯曲机构的所有部件（约10个零件）均由金刚石制成，从而确保在高强度XFEL光束中安全运行。该光谱仪对5 keV光子的透过率为88%，对15 keV光子的透过率为98%。因此，它可用于XFEL运行期间X射线光谱的非侵入式诊断。
