Aoki Dan, Fukushima Kazuhiko
Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8601, Japan.
Methods Mol Biol. 2017;1544:249-256. doi: 10.1007/978-1-4939-6722-3_18.
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a recently developing analytical tool and a type of imaging mass spectrometry. TOF-SIMS provides mass spectral information with a lateral resolution on the order of submicrons, with widespread applicability. Sometimes, it is described as a surface analysis method without the requirement for sample pretreatment; however, several points need to be taken into account for the complete utilization of the capabilities of TOF-SIMS. In this chapter, we introduce methods for TOF-SIMS sample treatments, as well as basic knowledge of wood samples TOF-SIMS spectral and image data analysis.
飞行时间二次离子质谱（TOF-SIMS）是一种最近发展起来的分析工具，属于成像质谱的一种。TOF-SIMS能提供横向分辨率在亚微米量级的质谱信息，具有广泛的适用性。有时，它被描述为一种无需样品预处理的表面分析方法；然而，要充分利用TOF-SIMS的功能，还需要考虑几个要点。在本章中，我们介绍了TOF-SIMS样品处理方法以及木材样品TOF-SIMS光谱和图像数据分析的基础知识。
