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用于非易失性低电压存储器的[Hdabco]BF 分子铁电薄膜的从头发现。

De Novo Discovery of [Hdabco]BF Molecular Ferroelectric Thin Film for Nonvolatile Low-Voltage Memories.

机构信息

Ordered Matter Science Research Center, Southeast University , Nanjing 211189, P. R. China.

出版信息

J Am Chem Soc. 2017 Jan 25;139(3):1319-1324. doi: 10.1021/jacs.6b12377. Epub 2017 Jan 17.

Abstract

To date, the field of ferroelectric random access memories (FeRAMs) is mainly dominated by inorganic ferroelectric thin films like Pb(Zr,Ti)O, which suffer from the issues of environmental harmfulness, high processing temperatures, and high fabrication costs. In these respects, molecular ferroelectric thin films are particularly advantageous and thus become promising alternatives to the conventional inorganic ones. For the prospect of FeRAMs applications, they should fulfill the requirements of effective polarization switching and low-voltage, high-speed operation. Despite recent advancements, molecular ferroelectric thin films with such high performance still remain a huge blank. Herein we present the first example of a large-area continuous biaxial molecular ferroelectric thin film that gets very close to the goal of application in FeRAMs: [Hdabco]BF (dabco = diazabicyclo[2.2.2]octane). In addition to excellent film performance, it is the coexistence of a low coercive voltage of ∼12 V and ultrafast polarization switching at a significantly high frequency of 20 kHz that affords [Hdabco]BF considerable potential for memory devices. Particularly, piezoresponse force microscopy (PFM) clearly demonstrates the four polarization directions and polarization switching at a low voltage down to ∼4.2 V (with an ∼150 nm thick film). This innovative work on high-performance molecular ferroelectric thin films, which can be compatible with wearable devices, will inject new vitality to the low-power information field.

摘要

迄今为止,铁电随机存取存储器 (FeRAM) 领域主要由 Pb(Zr,Ti)O 等无机铁电薄膜主导,但这些薄膜存在环境危害性、高温处理和高制造成本等问题。在这些方面,分子铁电薄膜具有特别的优势,因此成为传统无机薄膜的有前途的替代品。对于 FeRAM 应用的前景,它们应满足有效极化翻转和低电压、高速操作的要求。尽管最近取得了进展,但具有这种高性能的分子铁电薄膜仍然存在巨大的空白。在此,我们提出了第一个大面积连续双轴分子铁电薄膜的例子,该薄膜非常接近在 FeRAM 中应用的目标:[Hdabco]BF(dabco = 二氮杂二环[2.2.2]辛烷)。除了优异的薄膜性能外,低矫顽电压约为 12 V 和在显著高的 20 kHz 频率下的超快极化翻转的共存,使 [Hdabco]BF 非常有潜力用于存储器件。特别地,压电力显微镜 (PFM) 清楚地证明了四个极化方向和在低电压下的极化翻转低至约 4.2 V(具有约 150nm 厚的薄膜)。这项关于高性能分子铁电薄膜的创新工作,可以与可穿戴设备兼容,将为低功耗信息领域注入新的活力。

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