Zhang Yide, Vigil Genevieve D, Cao Lina, Khan Aamir A, Benirschke David, Ahmed Tahsin, Fay Patrick, Howard Scott S
Opt Lett. 2017 Jan 1;42(1):155-158. doi: 10.1364/OL.42.000155.
Fluorophore saturation is the key factor limiting the speed and excitation range of fluorescence lifetime imaging microscopy (FLIM). For example, fluorophore saturation causes incorrect lifetime measurements when using conventional frequency-domain FLIM at high excitation powers. In this Letter, we present an analytical theoretical description of this error and present a method for compensating for this error in order to extract correct lifetime measurements in the limit of fluorophore saturation. We perform a series of simulations and experiments to validate our methods. The simulations and experiments show a 13.2× and a 2.6× increase in excitation range, respectively. The presented method is based on algorithms that can be easily applied to existing FLIM setups.
荧光团饱和是限制荧光寿命成像显微镜(FLIM)速度和激发范围的关键因素。例如,当在高激发功率下使用传统频域FLIM时,荧光团饱和会导致寿命测量结果错误。在本信函中,我们给出了这种误差的解析理论描述,并提出了一种补偿该误差的方法,以便在荧光团饱和极限情况下提取正确的寿命测量值。我们进行了一系列模拟和实验来验证我们的方法。模拟和实验分别显示激发范围提高了13.2倍和2.6倍。所提出的方法基于可轻松应用于现有FLIM装置的算法。