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用于荧光寿命成像显微镜的饱和补偿测量。

Saturation-compensated measurements for fluorescence lifetime imaging microscopy.

作者信息

Zhang Yide, Vigil Genevieve D, Cao Lina, Khan Aamir A, Benirschke David, Ahmed Tahsin, Fay Patrick, Howard Scott S

出版信息

Opt Lett. 2017 Jan 1;42(1):155-158. doi: 10.1364/OL.42.000155.

Abstract

Fluorophore saturation is the key factor limiting the speed and excitation range of fluorescence lifetime imaging microscopy (FLIM). For example, fluorophore saturation causes incorrect lifetime measurements when using conventional frequency-domain FLIM at high excitation powers. In this Letter, we present an analytical theoretical description of this error and present a method for compensating for this error in order to extract correct lifetime measurements in the limit of fluorophore saturation. We perform a series of simulations and experiments to validate our methods. The simulations and experiments show a 13.2× and a 2.6× increase in excitation range, respectively. The presented method is based on algorithms that can be easily applied to existing FLIM setups.

摘要

荧光团饱和是限制荧光寿命成像显微镜(FLIM)速度和激发范围的关键因素。例如,当在高激发功率下使用传统频域FLIM时,荧光团饱和会导致寿命测量结果错误。在本信函中,我们给出了这种误差的解析理论描述,并提出了一种补偿该误差的方法,以便在荧光团饱和极限情况下提取正确的寿命测量值。我们进行了一系列模拟和实验来验证我们的方法。模拟和实验分别显示激发范围提高了13.2倍和2.6倍。所提出的方法基于可轻松应用于现有FLIM装置的算法。

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